Hostname: page-component-77c89778f8-9q27g Total loading time: 0 Render date: 2024-07-20T06:32:41.174Z Has data issue: false hasContentIssue false

Advances And Enhancements in Light Element EDXRF

Published online by Cambridge University Press:  06 March 2019

James R. Bogert*
Affiliation:
Kevex Corporation 1101 Chess Drive Foster City, CA 9M0H
Get access

Extract

One of the strongest analytical qualities of energy-dispersive x-ray fluorescence (EDXRF) is the wide range of analyte elements that can be detected and analyzed. Historically, the technique has covered all the elements from sodium (Z=11) and above. A useful measure of specific spectrometer performance is analyte sensitivity. X-ray spectrometric sensitivity is usually expressed in terms of minimum detectable amount of analyte or rate of change of analyte line intensity with change in amount of analyte. Many factors affect analyte sensitivity in EDXRF. These include excitation conditions, specimen conditions, system geometry, atmosphere, detector and readout conditions, and of course the specific analyte line. Typically, EDXRF sensitivity is very good, and low ppm concentrations of analytes are routinely analyzed–until one encounters the light elements.

Type
VII. XRF Techniques, Instrumentation and Mathematical Models
Copyright
Copyright © International Centre for Diffraction Data 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)