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An Automated On-Stream XRD Analyser for Process Control in the Phosphate Industry
Published online by Cambridge University Press: 06 March 2019
Abstract
A dedicated on-stream X-ray diffraction (XRD) system for the analysis of rock phosphate-bearing slurries was configured to the requirements of industry for process control. The slurry-handling system includes a multiplexer, header tank, de-aerator, sample splitters and two windowless sample presenters. The x-ray system is comprises a line-focus molybdenum anode X-ray tube, two pyrolytic graphite primary-beam monochromators, two vertical fixed-geometry goniometers, and a simultaneous four scintillation-detector system. The X-ray beam is transmitted through the slurry curtains so that the forward diffracted X-ray intensities of apatite (francolite) and quartz are measured simultaneously. Data obtained by the on-stream XRD analyses of apatite and quartz in rock phosphate from the Florida area in the USA are presented. Lower limits of detection in the order of 0.1 per cent can be achieved for both the apatite and quartz in slurries containing 30 per cent solids. The solids content is a variable that must be known if feeds, tailings, and concentrates are to be measured using a universal algorithm. It can be calculated from the total mineral content of the slurry or from density measurements.
- Type
- VI. Whole Pattern Fitting, Phase Analysis by Diffraction Methods
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1992
References
1.
de Villiers, J.P.R., Ormrod, G. T. W. and Cole, A. E., On-stream analysis, by X-ray diffraction, of apatite-containing slurries, Spec. Publ. geol. Soc. S. Afr.
7: 435 (1983).Google Scholar
2.
Cole, A. E. and de Villiers, J.P.R., Calibration and continuous measurement of apatite-containing slurries at Phosphate Development Corp., using X-ray diffraction, in Applied Mineralogy, Proc. Int. Congress Appl. Miner, Metallurgical Society of AIME, 89-102(1985).Google Scholar
3.
de Villiers, J.P.R., On-line analysis, by X-ray diffraction, of fluorspar-containing slurries, Report No. 2134D, Mintek, Randburg, (1981).Google Scholar
4.
Clark, W., “The development of apparatus and techniques for the coupled X-ray diffractometric analysis of slurries”, Unpublished MSc-thesis, in Afrikaans, Rand Afrikaans University, Johannesburg, South Africa (1985).Google Scholar
5.
de Villiers, J.P.R., Clark, W. and van den Heever, P. C., Quantitative analysis of fluorspar-containing slurries: A comparison of X-ray diffraction geometries, in Abstracts of the 15th General Meeting of the International Mineralogical Association, Beijing (1990).Google Scholar
6.
Engelbrecht, J. P., de villiers, J.P.R. and de, S. W. Bruyn, The on-stream X-ray analysis of slurries for process control, Advan. X-ray Anal.: 35,in press (1992)Google Scholar
7.
de Villiers, J.P.R., A preliminary on-line analysis by X-ray diffraction of pyrite-containing slurries, Report No. 2135D, Mintek, Randburg(1981).Google Scholar
8.
Klug, H. P. and Alexander, L. E., “X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials,” John Wiley & Sons, New York (1974)Google Scholar
9.
Jenkins, R., “An introduction to X-ray spectrometry,” Heyden & Son Ltd, London (1974).Google Scholar