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An Inexpensive In-House EXAFS Spectrometer

Published online by Cambridge University Press:  06 March 2019

P. Georgopoulos  and
C. H. Tang
P. Georgopoulos
Affiliation:
Dept. of Materials Science and Engineering, The Technological Institute, Northwestern University, Evanston, IL 60201
C. H. Tang
Affiliation:
Dept. of Materials Science and Engineering, The Technological Institute, Northwestern University, Evanston, IL 60201
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Extract

Given the vast superiority of synchrotron radiation sources for EXAFS and near-edge measurements, one might assume that conducting such experiments in the laboratory is a waste of time and resources. Upon more careful consideration of the realities of everyday research, however, one can easily see that this is not true. In fact, many people have come to this realization, so much so that a whole conference has been devoted to laboratory EXAFS facilities, their role in research and their relation to synchrotron facilities. The concensus after the conference was that laboratory instruments can and have been developed, with adequate performance for a variety of nontrivial experiments. They usually employ dedicated focusing spectrometers, rotating anode generators and fairly expensive monochromator crystals (see articles in ref. 1 and 2).

Type
III. Position Sensitive Detectors and X-Ray Instrumentation
Information
Advances in X-Ray Analysis , Volume 27: Thirty-Second Annual Conference on Applications of X-ray Analysis, August 1-5, 1983 , 1983 , pp. 299 - 305
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1. “Laboratory EXAFS Facilities-1980” (Univ. of Washington Workshop, AIP Conf. Proc. no. 64, Stern, E. A., ed., New York (1980).Google Scholar
2. Thulke, W., Haenael, R. and Rabe, P., Versatile Curved Crystal Spectrometer for Laboratory Extended X-ray Absorption Fine Structure Measurements, Rev. Sci. Instrum. 54:277 (1983).Google Scholar
3. Lu, K. Q. and Stern, E. A., Johann and Johansson Focusing Arrangements:Analytical Analysis, AIP Conf. Proc. no. 64, Stern, E. A., ed., New York (1980).Google Scholar
4. Georgopoulos, P. and Knapp, G. S., Design Criteria for a Laboratory EXAFS Facility, Appl. Cryst. 14:3 (1981).Google Scholar
5. Tang, C. H., Local Atomic and Electronic Arrangements in WxV1-xO2, Ph.D Thesis, Northwestern Univ., Evanston, IL.Google Scholar
6. Morrison, T. I., Shenoy, G. K. and Niarchos, D., Noise Level and Resolution Effects in EXAFS Spectra, J-Appl. Cryst. 15:388 (1982).Google Scholar