Hostname: page-component-77c89778f8-vpsfw Total loading time: 0 Render date: 2024-07-20T06:24:07.713Z Has data issue: false hasContentIssue false
  • English
  • Français

Appearance Potential X-Ray Fluorescence Analysis

Published online by Cambridge University Press:  06 March 2019

J. P. Kirkland ,
J. V. Gilfrich  and
W. T. Elam
J. P. Kirkland
Affiliation:
Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 2C375-5000
J. V. Gilfrich
Affiliation:
Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 2C375-5000
W. T. Elam
Affiliation:
Condensed Matter Physics Branch Naval Research Laboratory Washington, DC 2C375-5000
Get access

Summary

Appearance potential spectroscopy has been practiced for many years. In essence, it simply involves ramping the energy of the exciting quanta across excitation edges and observing the onset of a signal. Because of the relative simplicity with which the energy can be controlled, electrons have been the conventional quanta employed. The signals which have "appeared", characteristic of the atoms being studied, have been either Auger electrons or x-ray. The literature is replete with references to appearance potential measurements; the applications have, for the most part, demonstrated interesting physics, but analytical measurements have not been numerous.

Type
VIII. Synchrotron Radiation and Other Applications of XRF
Information
Advances in X-Ray Analysis , Volume 31: Thirty-Sixth Annual Conference on Applications of X-ray Analysis, August 3-7, 1987 , 1987 , pp. 479 - 486
Copyright
Copyright © International Centre for Diffraction Data 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Park, R.L. and Houston, J.E., Soft X-Ray Appearance Potential Spectroscopy, J. Vac. Sci. Technol. 11: 1 (1974).Google Scholar
2. Konishi, R. and Kato, S., Quasi-Instantaneous Measurements of Titanium Compounds Using Auger Electron and Auger Electron Appearance Potential Spectroscopies, Jtin. J. Appl. Phys. Part 1 23: 975 (1984).Google Scholar
3. Shulakov, A.S., Zimkina, T.M. and Stepanov, A.P., Nature of the Lanthanum Appearance Potentials s Spectrum Fine Structure, Sov. Phvs. Solid State 27: 65 (1985).Google Scholar
4. Hatwar, T.K. and Chopra, D., Soft X-Ray Appearance-Potential Study of Ti-Ni System, Surface and Interface Analysis 7: 93 (1985).Google Scholar
5. Englemann, H. J., Berndt, K. and. Storbeck, F., Quantitative Chemical Analysis of 3d Transition Metal Aloys by SXA.S. Phvs. Stat. Sol. fa) 86: 499 (1984).Google Scholar
6. Jaklevic, S.J., Kirby, J.A., Klein, M.P., Robertson, A.S., Brown, G.S. and P. Eisenberger, Fluorescence Detection of EXAFS; Sensitivity Enhancement for Dilute Species and Thin Films, Solid State Comm. 23: 679 (1977).Google Scholar
7. Kirkland, J.P., Nagel, D.J. and Cowan, P.L., The Naval Research Laboratory Materials Analysis Beam Line at the National Synchrotron Light Source, Nucl. Instrum. Meth. 208: 49 (1983).Google Scholar
8. Kaiser, R.A., Kirkland, J.P., Elam, W.T., and Sampath, S, Optical Performance of the Naval Research Laboratory's Materials Analysis Beam Line at the NS.S. submitted to Nucl, Instrum. Meth. (1987).Google Scholar
9. Gilfrich, J.V., Skelton, E.F., Qadri, S.B., Kirkland, J.P., and Nagel, D.J., Synchrotron Radiation X-Ray Fluorescence Analysis, Anal. Chem. 55: 187 (1963).Google Scholar
10. Gilfrich, J.V., Naval Research Laboratory, unpublished data (1987).Google Scholar
11. Knapp, G.S. and Georgopoulos, P., General Considerations for a Laboratory EXAFS Facility, in: “Laboratory EXAFS Facilities - 1980,” Stern, E.A., ed. , AIP Conference Proceedings No. 64, American Institute of Physics, New York, 1980.Google Scholar