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Application of Heavy Charged Particle Induced X-Ray Emission to the Trace Element Analysis of Human Tissue and Blood Serum

Published online by Cambridge University Press:  06 March 2019

R. L. Watson ,
C. J. McNeal  and
F. E. Jenson
R. L. Watson
Affiliation:
Department of Chemistry and Cyclotron Institute, Texas A&M University, College Station, Texas 77843
C. J. McNeal
Affiliation:
Department of Chemistry and Cyclotron Institute, Texas A&M University, College Station, Texas 77843
F. E. Jenson
Affiliation:
Department of Chemistry and Cyclotron Institute, Texas A&M University, College Station, Texas 77843
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Abstract

Measurements of peak-to-background ratios for K x-ray production by 1.7 MeV/amu protons, alpha particles, carbon ions, and neon ions have been carried out for the purpose of determining the optimum projectile atomic number for particle induced x-ray emission analysis. The feasibility of applying the method to the trace element analysis of thick samples of tissue and blood serum has been explored.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 18: Twenty-Third Annual Conference on Applications of X-ray Analysis, August 7-9, 1974 , 1974 , pp. 288 - 298
Copyright
Copyright © International Centre for Diffraction Data 1974

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References

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