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Characterization of Epitaxial High Tc Superconductors using a Parallel Beam X-Ray Diffractometer
Published online by Cambridge University Press: 06 March 2019
Abstract
Many analytical problems cannot be solved using a single XRD measurement. One example is the epitaxial growth of thin films of High Tc superconductors. To fully characterise such a sample it is necessary to study both the orientation (texture) and the phase composition of the layer.
- Type
- III. Thin-Film and Surface Characterization by XRD
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- Copyright © International Centre for Diffraction Data 1991