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The Characterization of Large Single Crystals by High-Voltage X-Ray Laue Photographs

Published online by Cambridge University Press:  06 March 2019

H. S. Peiser  and
E. P. Levine
H. S. Peiser
Affiliation:
National Bureau of Standards Washington, B.C.
E. P. Levine
Affiliation:
National Bureau of Standards Washington, B.C.
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Abstract

Large single crystals can be examined by conventional X-ray diffraction procedures only at their surface or by destructive sectioning. Within the limitations inherent in polychromatic X-ray photography, high-voltage Laue pictures arc shown to give some information on the internal quality of large crystals.

Asterism in conventional Laue photographs is contrasted, with streaks due to geometric effects in Laue patterns of large crystals. Detail within the streaks reveals subgrain structure. A primary extinction effect can be used as striking proof of good crystals being capable of scattering coherently over large distances.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 6: Eleventh Annual Conference on Applications of X-ray Analysis, August 8-10, 1962 , 1962 , pp. 158 - 163
Copyright
Copyright © International Centre for Diffraction Data 1962

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References

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