Hostname: page-component-77c89778f8-gq7q9 Total loading time: 0 Render date: 2024-07-20T22:19:05.585Z Has data issue: false hasContentIssue false

A Method of Liquid Analyses Providing Increased Sensitivity for Light Elements

Published online by Cambridge University Press:  06 March 2019

D. W. Beard
Affiliation:
Picker X-Ray Corporation Cleveland, Ohio
E. M. Proctor
Affiliation:
Picker X-Ray Corporation Cleveland, Ohio
Get access

Abstract

A method for analyzing solutions using a sample surface directly exposed to the primary X-ray beam is discussed. This method eliminates the need for the conventional Mylar covered liquid cells. The advantages of this method are the elimination of the scattering of the longer wavelength X-rays and the absorption effects due to the Mylar covering, thereby giving significant improvement in peak-to-background ratios and peak intensities for the light elements. This increased sensitivity can be used to improve the limits of detectability for light elements in solutions, broaden the range of practical elemental determinations, and reduce the counting time for any light element analysis in liquids.

A new liquid cell, developed for this technique, provides easily repeatable setting of target-to-sample distance and simplified preparation and handling of samples. A comparison between results obtained with conventional method and this uncovered sample surface method is made for typical solution applications.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1966

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Bertin, E. P., “Solution Techniques in X-Ray Spectrometric Analysis,” Norelco Reporter 12: 1526, 1965.Google Scholar
2. Ashby, W. D. and Proctor, E. M., “The Measurement of X-Ray Source Stability,“Picker Analyzer 4: 1965, Paper delivered at ACA meeting, Bozeman, Montana, 1964.Google Scholar
3. Lee, F. S. and Campbell, W. J., “Variation of X-Ray Spectral Line Position with Ambient Temperature Change: A Source of Error in X-Ray Spectrography,” Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, pp. 431442.Google Scholar
4. Henke, B. L., “Sodium and Magnesium Fluorescence Analysis—Part I: Method,” Advances in X-Ray Analysis, Vol. 6, Plenum Press, New York, 1963, p. 370.Google Scholar
5. Spielburg, N. and Bradinstein, Mechtide, “Instrumental Factors and Figure of Merit in the Detection of Low Concentrations by X-Ray Spectrochemical Analyses,” Appl. Spectr. 17: 6, 1963.Google Scholar
6. Birks, L. S., Electron Probe Microanalyiis, Interscience Publishers, New York, 1963, pp. 136138.Google Scholar