Hostname: page-component-77c89778f8-swr86 Total loading time: 0 Render date: 2024-07-17T15:38:24.719Z Has data issue: false hasContentIssue false

Multilayer Soap Film Structures*

Published online by Cambridge University Press:  06 March 2019

R. C. Ehlert
Affiliation:
General Electric Company Milwaukee, Wisconsin
R. A. Mattson
Affiliation:
General Electric Company Milwaukee, Wisconsin
Get access

Abstract

Multilayer soap film structures, particularly the lead stearate variety have been used for several years as a dispersing element in soft X-ray spectrometers. These structures have a high scattering power, and if a high order of diffraction is used for the shorter wavelengths they provide good resolution throughout the 10-80 Å range. Structures having a 2d spacing smaller than that of lead stearate (100 Å) would provide greater dispersion and, hence, resolution in the first order for radiation in the 10-40 Å range. Details concerning the conditions required to build multilayer structures from the soaps of shorter fatty acids such as lead myristate, lead laurate, lead caprate, etc. are given. The various members of the soap film family are compared regarding their diffracting power both as a function of wavelength and the order of diffraction. Information is given regarding the dependence of the diffracting power, the width of the diffraction peak at half maximum and the peak to background ratio as a function of the number of double layers in a structure. The absorption occurring within a lead stearate and a lead laurate structure has been experimentally measured. Observed spectra can, thus, be corrected for the filtration caused by the soap film structure. The soap film family is evaluated as a dispersing element by comparing the various Structures with single crystals such as EDDT and KAP.

Type
Research Article
Copyright
Copyright © International Centre for Diffraction Data 1966

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

This work was supported by the Air Force Materials Laboratory, Research and Technology Division, Air Force Systems Command, Wright-Patterson Air Force Base, Ohio.

References

1. Blodgett, K. B., “Films Built by Depositing Successive Monomolecular Layers on a Solid Surface,” J. Am. Chem. Soc. 57: 1007, 1935.Google Scholar
2. Furnas, T. C. Jr., and White, E. W., “A Program of Basic Research to Study X-Ray Spectra in the Region 15-50 A,” WADD Technical Report, 61-168, 1961.Google Scholar
3. Ehlert, R. C., “The Diffraction of X-Rays by Multilayer Stéarate Soap Film Structures,” Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, p. 325.Google Scholar
4. Fischer, D. W. and Baun, W. L., “Experimental Techniques for Soft X-Ray Spectroscopy,” WADD Technical Report, RTD-TDR-63-4232. Google Scholar
5. Henke, B. L., “X-Ray Fluorescence Analysis for Sodium, Fluorine, Oxygen, Nitrogen, Carbon, and Boron,” Advances in X-Ray Analysis, Vol. 7, Plenum Press, New York, 1964, p. 460.Google Scholar
6. Henke, B. L., “Some Notes on Ultrasoft X-Ray Fluorescence Analysis—10 to 100 Å Region,” Advances in X-Ray Analysis, Vol. 8, Plenum Press, New York, 1965, p. 269.Google Scholar
7. Mabis, A. J. and Knapp, K. T., “Multilayer Soap Films as Analyzing Crystals in X-Ray Spectroscopy,” Paper No. 140 presented at the Pittsburgh Conference on Analytical Chemistry and Applied Spectroscopy, March 4, 1964.Google Scholar
8. Ehlert, R. C. and Mattson, R. A.; “The Characteristic X-Rays from Boron and Beryllium,” Advances in X-Ray Analysis, Vol. 9, Plenum Press, New York, 1966, p. 456.Google Scholar
9. Mattson, R, A. and Ehlert, R. C., “The Application of a Soft X-Ray Spectrometer to Study the Oxygen and Fluorine Emission Lines from Oxides and Fluorides,” Advances in X-Ray Analysis, Vol. 9, Plenum Press, New York, 1966, p. 471.Google Scholar
10. Blodgett, K. B. and Langmuir, I., “Built-Up Films of Barium Stéarate and Their Optical Properties,” Phys. Rev. 51: 964, 1937.Google Scholar
11. Sher, I, H. and Chanley, J. D., “New Technique for Compressing Surface Films,” R.S.I. 26 (3), 266, 1955.Google Scholar
12. Mattson, R. A. and Ehlert, R. C., “Carbon Characteristic X-Rays from Gaseous Compounds,” paper presented at Conference on Applications of X-Ray Analysis, Denver, 1966.Google Scholar