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A New in Situ, Automatic, Strain-Measuring X-Ray Diffraction Apparatus with PSD

Published online by Cambridge University Press:  06 March 2019

Louis Castex
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de L'Hôpital, 75640 Paris, France
Jean-Michel Sprauel
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de L'Hôpital, 75640 Paris, France
Marc Barral
Affiliation:
Ecole Nationale Supérieure d'Arts et Métiers, 151, Boulevard de L'Hôpital, 75640 Paris, France
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Extract

In order to increase the versatility of in-situ X-ray equipment for stress measurements, we decided to design and construct our own easily transportable apparatus. Similar equipments are already commercialized: (i) in Japan (RIGAKU STRAINFLEX, SHIMADZU); (ii) in West Germany (SIEMENS); (iii) in the USA (TEC). After the commercialization of PSD or PSSC, several prototypes were developed among which, the apparatus of Ruud, James, CETIM… Our own apparatus has been developed for two main reasons:

  1. (i) For 1971, we have been working to ameliorate our own equipments effectively and frequently used for in situ measurements.

  2. (ii) We need a very precise and rapid apparatus amainable for the greatest number possible of applications.

Type
III. Position Sensitive Detectors and X-Ray Instrumentation
Copyright
Copyright © International Centre for Diffraction Data 1983

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References

1-Ruud, C. O., Dimascio, P. S. and Melcher, D.M., Application of a PSD for non-destructive residual stress measurements Inside stainless steel piping, Adv. in X-ray Anal., 26, 1983, pp.233243 Google Scholar
2-James, M. and Cohen, J. B., PARS:a portable X-ray analyser for residual stresses, J. T. E . V. A., 6, n°2, 1978, pp. 9197 Google Scholar
3-Barbarin, P., Convert, F. and Miege, B., Mesure des contraintes residuelles par rayons X sur les structures metalliques (Xray residual stress measurements on metallic structure), Rech. et Develop-Contr. Ind., may 1982, pp.71-78Google Scholar
4-Castex, L., Lebrun, J. L. and Bras, S., A new position sensitive detector developed in France, Adv. in X-ray Anal., 24, 1981, pp.139–2Google Scholar
5-BARBIER, M., Bens, J., Etude et realisation d'un appareillage de radiocrlstallographie destiny a la mesure non-destructive des contraintes euperfieielles ‘in-situ’ en metallurgie (Study and realization of an X-ray apparatus for ‘in-situ’ non-destructive measurements of superficial stresses in metallurgy), contract DGRST n° 71-7-2671, 1974 Google Scholar
6-Castex, L., La determination des contraintes par diffractometrie X (Stress determination by X-ray Diffractoraetry), Rev. Prat. de Contr. Ind.. 83, 1977, pp. 2528 Google Scholar