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NIST SRM 2708, Zinc Sulfide Thin Film on Polycarbonate for X-Ray Fluorescence Spectrometry

Published online by Cambridge University Press:  06 March 2019

P.A. Pella
Affiliation:
National Institute of Standards and Technology Gaithersburg, MD
W.R. Kelly
Affiliation:
National Institute of Standards and Technology Gaithersburg, MD
K.E. Murphy
Affiliation:
National Institute of Standards and Technology Gaithersburg, MD
E.B. Steel
Affiliation:
National Institute of Standards and Technology Gaithersburg, MD
S.B. Schiller
Affiliation:
National Institute of Standards and Technology Gaithersburg, MD
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Extract

NIST SRM 2708 is a thin film of zinc sulfide approximately 0.02 μm thick that was sputter deposited on polycarbonate substrates using a NIST ion-beam instrument. It is intended for the standardization of x-ray fluorescence spectrometers, especially for analysis of air particulates or similar material collected on filter media.

Type
V. X-Ray Characterization of Thin Films
Copyright
Copyright © International Centre for Diffraction Data 1992

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References

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