Hostname: page-component-5c6d5d7d68-tdptf Total loading time: 0 Render date: 2024-08-18T07:22:49.750Z Has data issue: false hasContentIssue false
  • English
  • Français

Pc Software for Rim Quantitative X-Ray Diffraction Analysis

Published online by Cambridge University Press:  06 March 2019

BriantL. Davis
BriantL. Davis*
Affiliation:
Davts Consulting Group 4022 Helen Court, Rapid City, SD 57702
Get access

Extract

Quantitative multicomponent analysis of phases by x-ray diffraction still remains one of the most difficult applications of any element or phase spectroscopic method. The level of quality of XRD quantitative analysis is largely in the hands of the operator, but several relatively new methods for processing basic diffraction data are becoming known and more frequently used, including fulltrace (observed and calculated) subtraction methods (Smith et al, 1988), Rietveld procedures (Bish and Howard, 1988; Taylor and Aldridge, 1993), and chemical “apportionment” target-transformation methods (Starks, et al, 1984). In spite of these new advances, the single or multiple peak reference intensity ratio (RIR, or kj) procedure remains a simple and attractive technique for routine quantitative XRD analysis (Schreiner, 1995; Snyder, 1992; Davis, 1992).

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 589 - 597
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Bish, D. L., and Howard, S. A., 1988, Quantitative Analysis Using the Rietveld Method, J. Appl. Cryst. 21, 86–91.Google Scholar
Calvert, L. D., Sirianni, A. F., and Gainsford, G. J., 1983, A Comparison of Methods for Reducing Preferred Orientation. Adv. X-Ray Anal. 26, 105–110.Google Scholar
Chipera, S. J., and Bish, D. L., 1995, Multireflection RJR and Intensity Normalizations for Quantitative Analyses: Applications to Feldspars and Zeolites. Powd. Diff., 10, 47-55. Google Scholar
Chung, F. H., 1974, Quantitative Interpretation of X-ray Diffraction Patterns of Mixtures. II, Adiabatic Principle of X-ray Diffraction Analysis of Mixtures. J. Appl. Cryst. 7, 526–531.Google Scholar
Davis, B. L., 1984, Reference Intensity Quantitative Analysis Using Thin-Layer Aerosol Samples. Adv. X-ray Anal, 27, 339–348.Google Scholar
Davis, B. L., 1986, A Tubular Aerosol Suspension Chamber for the Preparation of Powder Samples for X-ray Diffraction Analysis. Powd. Diff, I, No. 3, 240–243.Google Scholar
Davis, B. L., and Johnson, L. R., 1987, The Use of Mass Absorption in Quantitative X-ray Diffraction Analysis. Adv. X-ray Anal. 30, 333–342.Google Scholar
Davis, B.L, 1992, Quantitative Phase Analysis with Reference Intensity Ratios. N. I. S. T. Spec. Pub. 846 (Conf In Accuracy in Powder Diffraction, Gaithersburg, MD May 26-29, 1992), 7-16.Google Scholar
Dollase, W. A., 1936, Correction of Intensities for Preferred Orientation in Powder Diffractometry: Application of the March Model, J. Appl. Cryst. 19, 267–272.Google Scholar
Schreiner, W., 1995, A Standard Test Method for the Determination of RIR Values by X-ray Diffraction. Powd. Diff., 10, 25–33.Google Scholar
Smith, D. K., Johnson, G, G., and Wims, A. M., 1988, Use of Full Diffraction Spectra, Both Experimental and Calculated, in Quantitative Powder Diffraction Analysis. Aust. J. Phys., 41, 311- 321.Google Scholar
Starks, T. H., Fang, J. H., and Zevin, L. S., 1984, A Standardless Method of Quantitative X-Ray Diffractometry Using Target-Transformation Factor Analysis. Mathem. Geology, 16, 351-307. Google Scholar
Snyder, R. L., 1992, The Use of Reference Intensity Ratios in X-Ray Quantitative Analysis, Powd. Diff.,7, 186–193.Google Scholar
Taylor, J. C., and Aldridge, L. P., 1993, Full-Profile Rietveld Quantitative XRD Analysis of Portland Cement: Standard XRD Profiles for the Major Phase Tricalcium Silicate (C3S: 3CaO. SiO2). Powd. Difr., 8, 138–144.Google Scholar