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Powder Diffraction Data Correction: Single-Crystal Standards and Fourier Asymmetric Component Stripping

Published online by Cambridge University Press:  06 March 2019

Frank E. Briden  and
Richard B. Snoddy
Frank E. Briden
Affiliation:
U.S. Environmental Protection Agency Air and Energy Engineering Research Laboratory Research Triangle Park, NC 27711
Richard B. Snoddy
Affiliation:
Acurex Corporation 4915 Prospectus Drive Durham, NC 27713
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Extract

The need for reliable standards for the characterization of x-ray powder diffraction (XRD) instruments has been well documented. As a result of the round robin study, of various candidate standard materials, described by Fawcett et al., the National Institute of Science and Technology has made the SRM-660, lanthanum hexaboride, XRD peak width standard available. It has been normal practice to use powder sample standards for XRD powder diffraction studies. Powder standards have been justified on the principle that standards should be as much as possible like the unknowns to be analyzed; however, standards must be quite different from the unknowns because their peak profiles must be as narrow as possible for deconvolution from sample peak profiles. It would seem most advantageous to use standards of the highest degree of crystallinity so that they would be useful over the maximum number of applications. Single crystals, with their extremely high crystallinity, offer that advantage.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 353 - 358
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

1. Fawcett, T.G., et al., Methods and Practices in X-ray Powder Diffraction, JCPDS-International Centre for Diffraction Data (1988).Google Scholar
2. Briden, F.E., and Natschke, D.F., Adv. in X-ray Anal. 32:437–441 (1989) .Google Scholar
3. Warren, B.E., “X-ray Diffraction,” Addison Wesley Co., (1969), Chapter 13.Google Scholar
4. Sauter, W.C. et al., Physios Letters 63A:313 (1989).Google Scholar