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Quantitative Analysis of Fluorine and Oxygen by X-ray Fluorescence Spectrometry Using a Layered Structure Analyzer

Published online by Cambridge University Press:  06 March 2019

Momoko Takemura  and
Hirobumi Ohmori
Momoko Takemura
Affiliation:
Toshiba R & D Center Komukai Toshiba–cho, Saiwai–ku Kawasaki, 210, Japan
Hirobumi Ohmori
Affiliation:
Toshiba R & D Center Komukai Toshiba–cho, Saiwai–ku Kawasaki, 210, Japan
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Extract

Recently, layered structure analyzers (called LSA for short) or layered synthetic microstructures (called LSM) with d spacing of several tens of Å, have been developed for use as X-ray analyzing devices in wave-length dispersive spectrometers. The lower detection limit for light elements of atomic numbers lower than 13 , such as aluminum, sodium, fluorine, oxygen, carbon and so on, has been greatly improved.

There have been several reports published regarding LSA (or LSM) applications to light element analyses.

Type
V. XRF Applications
Information
Advances in X-Ray Analysis , Volume 32: Thirty-Seventh Annual Conference on Applications of X-ray Analysis, August 1-5, 1988 , 1988 , pp. 185 - 190
Copyright
Copyright © International Centre for Diffraction Data 1988

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References

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