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Quantitative Analysis of Odd-Shaped Samples by X-Ray Fluorescence Spectrometry Using Intensity Ratios

Published online by Cambridge University Press:  06 March 2019

G. Platbrood  and
H. Van De Velde
G. Platbrood
Affiliation:
Laborelec, Laboratory of the Belgian Electricity Utilities, Rodestraat 125 - B-1630 Linkebeek, Belgium
H. Van De Velde
Affiliation:
Laborelec, Laboratory of the Belgian Electricity Utilities, Rodestraat 125 - B-1630 Linkebeek, Belgium
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Extract

In industrial laboratories, a great diversity of samples is usually presented for analysis (alloys, powders, solutions, …). Fast results are invariably required so that methods with minimal preparation times have to be developed. This paper discusses a method for quantitative analysis of metallic samples in the form of clippings or odd-shaped fragments where the specimen surface does not cover the total surface of the sample holder. In some laboratories it is common practice to use sample holders with a small orifice to analyse sample fragments, but this method strongly reduces the fluorescent intensities. We have the feeling that a method that uses the whole surface of the specimen should be much welcomed.

Type
III. XRF Fundamental Parameters and Data Analysis
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 133 - 141
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

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