Hostname: page-component-5c6d5d7d68-wp2c8 Total loading time: 0 Render date: 2024-08-17T14:20:18.100Z Has data issue: false hasContentIssue false
  • English
  • Français

Recent Developments in Txrf of Light Elements

Published online by Cambridge University Press:  06 March 2019

Christina Streli ,
V. Bauer  and
P. Wobrauschek
Christina Streli
Affiliation:
Atominstitut der Österreichischen Universitäten 115, A-1020 Wien, Austria
V. Bauer
Affiliation:
Atominstitut der Österreichischen Universitäten 115, A-1020 Wien, Austria
P. Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten 115, A-1020 Wien, Austria
Get access

Abstract

Total Reflection X-ray Fluorescence Analysis (TXRF) has been proved to be well suited for the energy dispersive analysis of light elements, as B, C, N, O, F, Na, Mg,.,. using a special spectrometer. It is equipped with a Ge(HP) detector offering a sufficient detection efficiency from 180 eV upwards. The obtainable detection limits especially of the light elements are mainly influenced by the excitation source, which should provide a large number of photons with an energy near the K-absorption edge of these elements (from 200 eV upwards). Commercially available X-ray tubes do not offer characteristic X-rays in that range. In former experiments a windowless X-ray tube was built to prevent the low energy X-rays from being attenuated in the Be window. Experiments have been performed using Cu as anode material.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 39: Forty-Fourth Annual Conference on Applications of X-ray Analysis, July 31 - August 4, 1995 , 1995 , pp. 771 - 779
Copyright
Copyright © International Centre for Diffraction Data 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Klockenkamper, R., Spectroscopy 5, 26 (1990)Google Scholar
2 Prange, A., Schwenke, H., Adv. X-Ray Anal. 85, 899 (1992)Google Scholar
3 Wobrauschek, P., Kregsamer, P., Streli, C., Aiginger, H. Adv. X-Ray Anal. 34, 1 (1991)Google Scholar
4 Streli, C., Aiginger, H., Wobrauschek, P., Spectrochim. Acta 48B, 163 (1993)Google Scholar
5 Streli, C., Wobrauschek, P., Aiginger, H., Nucl. Instr. Meth. A334, 425 (1993)Google Scholar
6 Streli, C., Wobrauschek, P., Aiginger, H., Ladisich, W., Rieder, R., Adv. X-ray Anal 37, 577(1994).Google Scholar
7 Streli, Ch., Wobrauschek, P., Ladisich, W., Rieder, R., Aiginger, H., Ryon, R. W., Pianetta, P., Nucl. Instr. Meth. A345, 399 (1994).Google Scholar
8 Streli, Ch., Wobrauschek, P., Ladisich, W., Rieder, R., Aiginger, H., X-Ray Spectrometry 24, 137 (1995)Google Scholar
9 Streli, C., Wobrauschek, P., Aiginger, H., Spectrochim. Acta 46B , 1351 (1991)Google Scholar
10 Arai, T., presentation at the postworksnop tour of the 5th TXRF workshop at RIGAKUG, Tsukuba, 1994.Google Scholar
11 Robinson, J. W., Handbook of Spectroscopy vol. l, 1979, CRCGoogle Scholar
12 Handbook of Chemistry and Physics, CRC Press, 57th EditionGoogle Scholar
13 Bauer, V., diploma thesis, Technical University Vienna, 1995Google Scholar
14 Bauer, V. et al, to be published 1995Google Scholar
15 van Espen, P., Nullens, H., Adams, F. , Nucl. Instr. Meth. 142, 243 (1977)Google Scholar