Hostname: page-component-5c6d5d7d68-wtssw Total loading time: 0 Render date: 2024-08-07T23:26:02.582Z Has data issue: false hasContentIssue false
  • English
  • Français

Software for XRF

Published online by Cambridge University Press:  06 March 2019

Michael Mantler
Michael Mantler*
Affiliation:
Institute of Applied and Technical PhysicsUniversity of Technology, Vienna, Austria
Get access

Extract

As in other fields of spectroscopy, software for x-ray fluorescent analysis has to assist the user in instrument control, raw data refinement, qualitative interpretation of spectral data, and computations for obtaining quantitative results. From a historical point of view, instrument automation and data evaluation routines tor large numbers of samples have been a most important incentive for the introduction of computers into x-ray analysis.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 13 - 20
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. N., Broll, P., Caussin, M., Peter: X-Ray Spectrom. 21, 43 (1992)Google Scholar
2. R., Rousseau: X-Ray Spectrom. 13, 121 and 115 (1984)Google Scholar
3. J., Sherman, Spectrochim.Acta 7, 283 (1955)Google Scholar
4. T., Shiraiwa, N., Fujino:, Jpn J.Appl.Phys. 5, 886 (1966)Google Scholar
5. J., Criss, L., Birks, Anal. Chem. 40, 1080 (1968)Google Scholar
6. T., Arai, T., Shoji, K., Omote: Advances in X-Ray Analysis 29, 413 (1986)Google Scholar
7. P., Pella, L., Feng, J., Small: X-Ray Spectrom, 14, 125 (1985)Google Scholar
8. W., McMaster, N., KerrDelGrande, J., Makket, J., Hubbell, Document UCRL 50174, U.S.Dept of Comm., Springfield, Va 22161 (1969)Google Scholar
9. J., Lcmux, T.Tbinh; “Revised Tables of X-Ray Mass Absorption Coefficients.” Claisse Scientific Corporation, Quebec (1977)Google Scholar
10. M., Mantler: Advances in X-Ray Analysis 36, 27 (1993)Google Scholar
11. S., Mori, M., Mander: Advances in X-Ray Analysis 36, 47 (1993)Google Scholar
12. M., Mantler: Anal.Chim. Acta 188, 25 (1986)Google Scholar
13. D. de, Boer; X-Ray Spectrom. 19, 145 (1990)Google Scholar
14. L., Feng: Advances in X-Ray Analysis 36, (1993)Google Scholar
15. J., Criss: “NRLXRF, A Fortran Program for XRFA”, NRL, Washington DC (1977)Google Scholar
16. D., Laguitton, M., Mantler, Advances in X-Ray Analysis 20, 171 (1977)Google Scholar
17. M., Kaufmann, M., Mantler, F., Weber: Advances in X-Ray Analysis 37 (submitted)Google Scholar
18. T., Huang, W., Parrish: Advances in X-Ray Analysis 29, 395 (1986)Google Scholar
19. D.de, Boer, J., Borstrok, A., Leenaers, H., van Sprang, P., Brouwer: X-Ray Spectrom 22, 33 (1993)Google Scholar
20. M., Grasserbauer: Habilitationsschrift, University of Technology, Vienna (1973)Google Scholar
21. T., Arai, T., Sohmura: Advances in X-Ray Analysis 26, 423 (1983)Google Scholar
22. M., Schuster, M., Miiller, K., Mauser, R., Straub: Thin Solid Films 157, 325 (1988)Google Scholar
23. F., Weber, M., Mantler, M., Kaufmann: Advances in X-Ray Analysis 37 (submitted)Google Scholar