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Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

Published online by Cambridge University Press:  06 March 2019

Tom O'Reilly  and
Bi-Shia W. King
Tom O'Reilly
Affiliation:
Kevex Corporation, Foster City, CA
Bi-Shia W. King
Affiliation:
U.S. Geological Survey, Menlo Park, CA
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Abstract

A new fundamental-parameter program has been developed which corrects for light element absorption based on the mean atomic number of the sample. The mean atomic number, in turn, is determined from the Compton/Rayleigh scatter intensity ratio. The program is quite flexible with regard to the number and the type of standards which may be used. The accuracy and precision of the method has been evaluated with several geological and biological standards. The results are in good agreement with those obtained by some other methods (CEMAS, XRF-11).

Type
III. XRF Fundamental Parameters and Data Analysis
Information
Advances in X-Ray Analysis , Volume 30: Thirty-Fifth Annual Conference on Applications of X-ray Analysis, August 4-8, 1986 , 1986 , pp. 165 - 174
Copyright
Copyright © International Centre for Diffraction Data 1986

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References

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