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X-Ray Profile Analysis of 12% Chromium Stainless Steel

Published online by Cambridge University Press:  06 March 2019

Zenjxo Yajima ,
Ken-ichi Ishikawa ,
Toshihiko Sasaki  and
Yukio Hirose
Zenjxo Yajima
Affiliation:
Department of Mechanical Engineering Kanazawa Institute of Technology 7-1 Oogigaoka, Nonoichi, Kanazawa 921, Japan
Ken-ichi Ishikawa
Affiliation:
Department of Mechanical Engineering Kanazawa Institute of Technology 7-1 Oogigaoka, Nonoichi, Kanazawa 921, Japan
Toshihiko Sasaki
Affiliation:
Department of Materials Science, Kanazawa University Kakuma-machi, Kanazawa 920-11, Japan
Yukio Hirose
Affiliation:
Department of Materials Science, Kanazawa University Kakuma-machi, Kanazawa 920-11, Japan
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Extract

X-ray line broadening is caused by variations in lattice strain and small particle size. When hydrogen is introduced into the steel by the electrolytica! method, structural changes are observed. X-ray line broadening is a suitable measurement in such cases. The Warren and Averbach Fourier analysis is a good method for line broadening studies. In this method, strain and particle size effects can be separated because broadening due to particle size is independent of order of the diffraction peaks, while broadening due to strain is not.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 351 - 358
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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