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Xrf With Tunable Monochromatic Excitation and Variation of the Incidence Angle

Published online by Cambridge University Press:  06 March 2019

Horst Ebel ,
Maria F. Ebel ,
Robert Svagera ,
Norbert Wirth ,
Roland Kaitna  and
Hartinut Schandl
Horst Ebel
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Maria F. Ebel
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Robert Svagera
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Norbert Wirth
Affiliation:
Technische Universität Wien Institut für Angewandte und Technische Physik Wiedner Hauptstraβe 8-10, A 1040 Vienna, AUSTRIA
Roland Kaitna
Affiliation:
Rokappa Laborinstrumente Krichbaumgasse 31, A 1120 Vienna, AUSTRIA
Hartinut Schandl
Affiliation:
Rokappa Laborinstrumente Krichbaumgasse 31, A 1120 Vienna, AUSTRIA
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Extract

The x-ray source of our instrument is a rotating anode system with a silver target. It is flanged to a He-filled monochromator chamber. The photon energy of the x-rays for the excitation of characteristic specimen radiation can be tuned continuously from IkeV to 30 keV. The cross-section of the beam - monochromatic or polychromatic tube radiation - leaving the monochromator chamber is variable within 0.1 and 100mm2. A Be-window separates the evacuable specimen chamber from the monochromator chamber. The specimen holder allows for a linear movement of the specimen in x- and y-direction normal to the beam of incident x-radiation and allows a laterally resolved analysis. A rotation around an axis normal to the incident x-ray beam enables investigations under variable incidence- and take-off angles. X-ray detection is performed by an energy dispersive system.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 619 - 627
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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