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Adaptation of the Fundamental Parameters Monte Carlo Simulation to EDXRF Analysis with Secondary Fluorescer X-Ray Machines
Published online by Cambridge University Press: 06 March 2019
Abstract
The Monte Carlo simulation method that has been previously developed and demonstrated for EDXRF analysis with annular radioisotope excitation sources is extended to systems using secondary fluorescer X-ray machines for excitation. Comparisons of the Monte Carlo predictions with experimental results indicate that the modification is valid.
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- Copyright © International Centre for Diffraction Data 1977
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