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Published online by Cambridge University Press: 06 March 2019
A variety of x-ray diffractometers supporting stress measurements, routine phase identification, precision lattice parameter determinations, crystallite size estimates, and high temperature studies have been interfaced to a central minicomputer. The unique attributes of each instrument have been retained while the central minicomputer provides a common control format, data storage area, and analysis program library. Two movable desk top computers provide limited backup for the minicomputer, and serve as test beds for technique development.