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A Comprehensive Approach to in Situ Stress Measurement

Published online by Cambridge University Press:  06 March 2019

R. A. Holt
R. A. Holt*
Affiliation:
Physical Metallurgy Research Laboratories Canada Centre for Mineral and Energy Technology, Ottawa Energy, Mines and Resources, Canada
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Recent developments in position sensitive detectors (PSD's), solid state power and computer technologies make it possible to design accurate instruments for in-situ stress measurement. Such instruments require compromises in the interests of portability, size and speed stiich may limit accuracy and/or versatility. Furthermore, extraction of a stress tensor from X-ray data is not always straightforward and considerable research is required before an instrument for X-ray stress measurement can be treated as a “black box” to be given to an uneducated operator.

The development of a new instrument for in-situ stress measurement is described in this paper. It was conceived as a field instrument with two position-sensitive proportional counters (PSPC's) for use in the single exposure mode (SET), and incorporates precise angular qontrol of the incident X-ray beam and data analysis to eliminate irregular Bragg peaks owing to coarse grain structure, An experimental instrument was built tc test the concept (1).

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 29: Thirty-Fourth Annual Conference on Applications of X-ray Analysis, August 5-9, 1985 , 1985 , pp. 29 - 35
Copyright
Copyright © International Centre for Diffraction Data 1985

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References

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