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Elemental X-Ray Imaging of Fossils

Published online by Cambridge University Press:  06 March 2019

R. W. Morton  and
K. C. Witherspoon
R. W. Morton
Affiliation:
Route 1, BOX 343, Bartlesville, OK 74003
K. C. Witherspoon
Affiliation:
Loral Space Information Systems, Houston, TX 77058
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Abstract

This paper describes the imaging of fossils using elemental x-ray area mapping (EXAM). The technique utilizes a commercially available instrument originally designed for the silicon chip industry. The EXAM data are processed digitally with imaging software to remove surface irregularities and enhance specimen details. Applications of this technique to specimens with irregular surfaces are described.

Type
III. XRS Techniques and Instrumentation
Information
Advances in X-Ray Analysis , Volume 36: Forty-First Annual Conference on Applications of X-ray Analysis, August 3-7, 1992 , 1992 , pp. 97 - 104
Copyright
Copyright © International Centre for Diffraction Data 1992

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