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Enhanced Range of Measurable Thickness of Thin Crystalline Layers Using θ/2θ Decoupled Powder X-ray Diffraction
Published online by Cambridge University Press: 06 March 2019
Extract
X-ray diffraction is one of the most useful methods for the characterisation of thin crystalline layers or coatings. The most interesting techniques are: the identification of phases and their relative quantities, texture analysis, and residual stress measurements.
Thin layers which are transparent to the x-ray beam (in the diffracted wavelength) yield different intensities as compared with a bulk sample.
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- Copyright © International Centre for Diffraction Data 1989