Hostname: page-component-68945f75b7-wph62 Total loading time: 0 Render date: 2024-08-06T06:55:17.379Z Has data issue: false hasContentIssue false
  • English
  • Français

High-Speed Retained Austenite Analysis with an Energy Dispersive X-Ray Diffraction Technique

Published online by Cambridge University Press:  06 March 2019

A. P. Voskamp
A. P. Voskamp*
Affiliation:
SKF European Research Centre B.V., Jutphaas, Netherlands
Get access

Summary

A time saving method has been applied for the determination of retained austenite.

The method involved is based on the approach of energy dispersive X-ray diffraction analysis. With this approach, polychromatic radiation from the X-ray tube is used and diffraction maxima will occur at a fixed angle 2θ in as many wavelengths or energies as “d“ values are present.

Giessen and Gordon published the first application of this method to powder diffraction analysis in 1968 for the identification of crystal structures. As the determination of retained austenite is a quantitative type of analysis, based upon identification of the crystal structure, the new approach should also be applicable in principle.

With almost 100 samples of unknown austenite content, experiments have been carried out both with the conventional and the energy dispersive X-ray diffraction technique. The results obtained are closely comparable and the retained austenite values together with the errors are shown.

For these measurements, experiments have been carried out with the energy dispersive technique to determine the relation between the known concentration of retained austenite in a number of standards and the intensity correction factors (R). The results obtained from these experiments have shown good reproducibility of the intensity correction factors.

Using this technique, a five-fold reduction in analysis time is possible over the conventional technique with no reduction in accuracy.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 124 - 138
Copyright
Copyright © International Centre for Diffraction Data 1973

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Brugger, R. M., Bennion, R.B., Worlton, T.G. and Peterson, E.R. “Neutron Diffraction Studies of Samples at High Pressure” Proceedings of a panel on research applications of Repetitively Pulsed Reactors and Boosters, Dubna USSR 1966. International Atomic Energy Agency, Vienna 1967 P 35.Google Scholar
2. Heath, R.L.,“The Application of High Resolution Solid State Detectors to X-ray Spectrometry-A Review”, Advances in X-ray Analysis, Vol.15, 1971.Google Scholar
3. Buras, B., Chwaszczewska, J. Szarras, S and Szmid, Z., “Fixed Angle Scattering Method for X-ray Crystal Structure Analysis”, Institute of Nuclear Research, Report 894/11/PS Warsaw, 1968.Google Scholar
4. Gisssen, B.C. and Gordon, C.E., “New High-Speed Technique Based on X-ray Spectrography”, Science, Vol 159, March 1968.Google Scholar
5. Sparks, C.J. Jr. and Gedcke, D.A., “Rapid Recording of Powder Diffraction Patterns with Si(Li) X-ray Energy Analysis System: W and Cu Targets and Error Analysis”, Advances in X-ray Analysis, Vol. 15, 1971.Google Scholar
6. Martin, G.W. and Klein, A.S., “A Complete Instrumental System for Energy Dispersive Diffractometry and Fluorescence Analysis”, Advances in X-ray Analysis, Vol 15 1971.Google Scholar
7. Lin, W., “A Rapid Fluorescence and Energy Powder Pattern Analysis System”, Advances in X-ray Analysis, Vol. 16, 1972.Google Scholar
8. Nutter, J.C., “A Non-dispersive On-stream X-ray Diffractometer for the Cement Industry”, Cement Technology, March/April, 1972.Google Scholar
9. Ferrell, R.E. Jr., “Applicability of Energy-dispersive X-ray Powder Diffractometry to Determinative Mineralogy”, The American Mineralogist, Vol. 56, 1971.Google Scholar
10. Cole, H., “Bragg's Law and Energy Sensitive Detectors”, Journal for Applied Crystallography 3, 405, 1970.Google Scholar
11. Banerjee, P and Charbit, P., “Rapid X-ray Diffraction Investigations by Means of a Si(Li) Semiconductor Detector”, Siemens Review, October 1971.Google Scholar
12. Laine, E., I.Lähteenmäki and M, Kantola, “Adaptation of Solid State Detector in X-ray Powder Diffractometry”, X-ray Spectrometry 1, 1972.Google Scholar
13. Gilfrich, J.V. and Birks, L.S., “Spectral Distribution of X-ray Tubes for Quantitative X-ray Fluorescence Analysis”, Analytical Chemistry, Vol 40, June 1968.Google Scholar
14. Cullity, “Elements of X-ray Diffraction”, Addison-Wesley Published Company Inc., 1956.Google Scholar
15. Lucas, G and Nützel, H., “Einverbessertes Verfahren zur röntgenographischen Bestimming des Restaustenits in gehärteten-Stählen”, Siemens-Z 35, (1961), S445.Google Scholar
16. Faninger, G. und Hartmann, U., “Physikalische Grundlagen der Quantitativen röntgenographischen Phasenanalyse”, Harterei Technische Mitteilungen, 27 (1972).Google Scholar
17. International Tables for X-ray Crystallography. Kynoch Press, Birmingham.Google Scholar