Hostname: page-component-7bb8b95d7b-5mhkq Total loading time: 0 Render date: 2024-09-17T14:08:18.481Z Has data issue: false hasContentIssue false
  • English
  • Français

Rapid Quantitative Analysis by X-Ray Spectrometry

Published online by Cambridge University Press:  06 March 2019

Robert D. Giauque  and
Joseph M. Jaklevic
Robert D. Giauque
Affiliation:
Lawrence Berkeley Laboratory, Univ. of Calif. Berkeley, California 94720
Joseph M. Jaklevic
Affiliation:
Lawrence Berkeley Laboratory, Univ. of Calif. Berkeley, California 94720
Get access

Abstract

An x-ray fluorescence analysis method applicable to the case of fluorescent spectra excited with monoenergetic x-rays has been developed. The technique employs a minimum number of calibration steps using single element thin film standards and depends upon theoretical cross sections and fluorescent yield data to interpolate from element to element. The samples are treated as thin films and corrections for absorption effects are easily determined- Enhancement effects, if not negligible, are minimized by sample dilution techniques or by selective excitation.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 15: Twentieth Annual Conference on Applications of X-ray Analysis, August 11-13, 1971 , 1971 , pp. 164 - 175
Copyright
Copyright © International Centre for Diffraction Data 1971

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Birks, L. S., X-ray Speetrochemical Analysis, p. 71–79, John Wiley and Sons, Inc. (1969).Google Scholar
2. Liebhafsky, H. A., Pfeiffer, H. G., Winslow, E. H., and Zemany, P. D., X-ray Absorption and Emission in Analytical Chemistry, p. 179–191, John Wiley and Sons, Inc. (1960).Google Scholar
4. Barbier, R., “Analytical Chemistry - On a Method of Absolute Quantitative Elemental Analysis by X-ray Fluorescence Spectrometry,” Proceedings Academy Science, Paris, Vol. 270, p. 158l–1584. (May 11, 1970).Google Scholar
3. Shiraiwa, T. and Fujino, N., “Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-rays,” in Barrett, C. S., Newkirk, J. B., and Mallett, G. R., Editors, Advances in X-ray Analysis, Vol. 12, p. 446–455, Plenum Press (1969).Google Scholar
5. Reference (2), p. 153-158.Google Scholar
6. McMaster, W. H., Del Grande, N. K., Mallett, J. H., and Hubbell, J. H., “Compilation of X-ray Cross Sections,” UCRL-50174, Section II, Revision I, Lawrence Livermore Laboratory, University of California, Livermore, California (1969).Google Scholar
7. Fink, R. W., Jopson, R. C., Mark, N., and Swift, C. D., “Atomic Fluorescence Yields,” Rev. Mod.Phys. 38, 513–540 (1966).Google Scholar
8. McGuire, E. J., “Atomic L-Shell Coster-Kronig, Auger, and Radiative Rates and Fluorescence Yields for Na-Th,” Phys. Rev. A3, 587–594 (1971).Google Scholar
9. Lederer, C. M., Hollander, J. M., and Perlman, I., Table of Isotopes, 6th Edition, p. 570–571, John Wiley and Sons, Inc. (1967).Google Scholar
10. Jaklevic, J. M., Giauque, R. D., Malone, D. F., and Searles, W. L., “Small X-ray Tubes for Energy Dispersive Spectrometers,” Advances in X-ray Analysis, Vol. 15, Plenum Press (to he published).Google Scholar
11. Giauque, R. D., “A Radioisotope Source-Target Assembly for X-ray Spectrometry,” Anal.Chem. 40, 2075–2077 (1968).Google Scholar
12. Goulding, F. S., Jaklevic, J. M., Jarrett, B. V., and Landis, D. A., “Detector Background and Sensitivity of X-ray Fluorescence Spectrometers,” Advances in X-ray Analysis, Vol. 15, Plenum Press (to he published).Google Scholar
13. Landis, D. A., Goulding, F. S., Pehl, R. H., and Walton, J. T., “Pulsed Feedback Techniques for Semiconductor Detector Radiation Spectrometers,” IEEE Transactions on Nuclear Science, Vol. NS-18, No. 1, p. 115–124 (1971).Google Scholar
14. Luke, C. L., “Determination of Trace Elements in Inorganic and Organic Materials by X-ray Fluorescence Spectrometry,” Anal. Chim.Acta 41, 239–230 (1968).Google Scholar
15. Salmon, M. E., “An Improved X-ray Fluorescence Method for the Analysis of Museum Objects,” in Henke, B. L., Newkirk, J. B., and Mallett, G. R., Editors, Advances in X-ray Analysis, Vol.13, p. 94–104, Plenum Press (1970).Google Scholar