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Residual Stress Depth Profiling on Ground and on Polished Surfaces of an Al2O3/SiC(w) Composite
Published online by Cambridge University Press: 06 March 2019
Abstract
This study uses the asymmetric grazing incidence x-ray diffraction (GIXD) method and related z-profile retrieval techniques to study the near surface residual stress depth proflles on ground and on polished surfaces of hot-pressed Al2O2SiC(w) composite specimen. The z-profiles of stress components σ11, σ22 and σ33 of the Al2O3 matrix were obtained by using the numerical inversion method as well as the inverse Laplace method. Both τ- and z-profiles of residual stresses are presented.
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