Hostname: page-component-5c6d5d7d68-pkt8n Total loading time: 0 Render date: 2024-08-27T14:29:16.625Z Has data issue: false hasContentIssue false
  • English
  • Français

Short-term memory depends on the level of emotional burnout

Published online by Cambridge University Press:  27 August 2024

S. Tukaiev ,
I. Zyma  and
M. Makarchuk
S. Tukaiev*
Affiliation:
1Institute of Biology and Medicine, Taras Shevchenko National University of Kyiv, Kyiv, Ukraine 2Faculty of Communication, Culture, and Society, Institute of Public Health, Università della Svizzera italiana, Lugano, Switzerland
I. Zyma
Affiliation:
1Institute of Biology and Medicine, Taras Shevchenko National University of Kyiv, Kyiv, Ukraine
M. Makarchuk
Affiliation:
1Institute of Biology and Medicine, Taras Shevchenko National University of Kyiv, Kyiv, Ukraine
*
*Corresponding author.

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Introduction

Emotional burnout refers to a syndrome caused by chronic stress. The formation of emotional burnout may lead to persistent changes in cognitive activity and particularly in memory and attention.

Objectives

As the power of human EEG-spectrum components varies significantly under cognitive testing, the aim of our study was to investigate the dynamics of changes of EEG parameters under a memory task depending on the severity of burnout.

Methods

42 healthy volunteers (students aged 18 to 24 years) participated in this study. EEG was registered over a period of 3 minutes during the rest state and 10 minutes during a verbal memory task. The spectral power density (SPD) of all frequencies from 0.2 to 35 Hz was estimated. The Mann-Witney criterion was carried out for the comparison of the independent data samples. The correlations were estimated using the Spearmen’s coefficient correlation. In order to determine the stages of burnout we used the test “Syndrome of emotional burnout” (by Boyko), adapted for students.

Results

We observed variations in parameters of EEG during memorizing and retention phases depending on the intensity of the burnout. The intensity of the Exhaustion stage varied inversely with SPD in alpha3 (parietal and temporal regions), beta1 (parietal regions) and beta2 (parietal, right occipital and temporal regions) during the memorizing phase. The formation of the Exhaustion stage of burnout was accompanied by a decrease in alpha3 (parietal, left occipital and right temporal regions), beta1 (parietal, occipital and left temporal regions) and beta2 (parietal regions) during the retention phase.

Conclusions

Our data indicate that short-term memory depends on the emotional state of subjects.

Disclosure of Interest

None Declared

Type
Abstract
Information
European Psychiatry , Volume 67 , Special Issue S1: Abstracts of the 32nd European Congress of Psychiatry , April 2024 , pp. S380
Creative Commons
Creative Common License - CCCreative Common License - BY
This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (https://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.
Copyright
© The Author(s), 2024. Published by Cambridge University Press on behalf of European Psychiatric Association
Submit a response

Comments

No Comments have been published for this article.