No CrossRef data available.
Article contents
A High Resolution Echelle Spectrometer for Soft X-ray and EUV Astronomy
Published online by Cambridge University Press: 12 April 2016
Abstract
We present a new design for high resolution spectroscopy from 80 to 400 Å. This design employs grazing incidence optics and variable line-spaced gratings to achieve high resolution. Unlike some previously proposed EUV echelles, this design employs straight groove planar gratings, which are a well-proven, easily manufactured design. The instrument delivers a peak resolution of λ/Δλ = 7500 and a peak effective area of 3 cm2.
- Type
- 9. Future X-ray Observatories, Detectors and Instrumentation
- Information
- Copyright
- Copyright © Cambridge University Press 1990