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An RF spectrometer for fast wide band measurement

Published online by Cambridge University Press:  18 January 2010

Simon Hemour*
Affiliation:
IMEP-LAHC, Grenoble-Chambéry, France.
Florence Podevin
Affiliation:
IMEP-LAHC, Grenoble-Chambéry, France.
Pascal Xavier
Affiliation:
IMEP-LAHC, Grenoble-Chambéry, France.
*
Corresponding author: S. Hemour Email: simon.hemour@minatec.grenoble-inp.fr

Abstract

A new type of spectrum analyzer using RF interferometry is presented. The stationary wave integrated Fourier transform spectrometer is dedicated to the measurement of transient wideband signals. The spectrometer is mobile and cheap. It consists of spatial samplers placed along a waveguide ended by a short circuit. The standing wave caused by the short circuit is sampled and the spectrum is obtained by an FFT computation. A 0.3–5 GHz analyzer was built as a proof-of-principle demonstration and an application to RF dosimetry is shown.

Type
Original Article
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2010

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References

REFERENCES

[1]Transportable monitoring and direction finding systems TMS110/TMS210, datasheet, Rohde & Schwarz, May 2004.Google Scholar
[2]VHF/UHF Digital Wideband Receiver, EM 550, datasheet, Rohde & Schwarz, June 2006.Google Scholar
[3]De Seze, R. et al. : Expométrie aux Champs Radiofrequences : évaluation des dosimètres, in Conf. sur les Effets biologiques et sanitaires des rayonnements non ionisants, SFRP, 7 October 2008.Google Scholar
[4]WiFi Spectrum Analyzer, WiSA 2.4, CORNET Microsystems Inc., 2008.Google Scholar
[5]Lippmann, G.: La photographie des couleurs. C. R. Acad. Sci. Paris, 112 (1891), 274275.Google Scholar
[6]Blum, E.-J.: Les mesures spectrales en radioastronomie. Compte-rendu Acad. Sci., séance du 16 mai 1960, May 1960, pp. 32793281.Google Scholar
[7]Harris, A.I.; Zmuidzinas, J.: A wide-band lag correlator for heterodyne spectroscopy of broad astronomical and atmospheric spectral lines. Rev. Sci. Inst., 72 (2001), 15311538.CrossRefGoogle Scholar
[8]Williams, W.L.: Computer-aided measurement of microwave circuits. Ph.D. dissertation, California Inst. Technol., Pasadena, 1989.Google Scholar
[9]Le Coarer, E.; Benech, P.: Patent 04/52992, 15 Dec. 2004.Google Scholar
[10]Hemour, S.; Podevin, F.; Rauly, D.; Xavier, P.: RF stationary waves integrated Fourier transform spectrometer. Microw. Opt. Technol. Lett., 49 (2007), 11381142.CrossRefGoogle Scholar
[11]Le Coarer, E. et al. : Stationary waves integrated Fourier transform spectrometry (SWIFTS): towards an ultimate wavelength scale spectrometer. Nat. Photonics, 8 (2007), 473478.CrossRefGoogle Scholar
[12]Ferrand, J.; Custillon, G.; Kochtcheev, S. et al. : A SWIFTS operating in visible and near-infrared. Proc. SPIE, 7010 (2008), 701046.CrossRefGoogle Scholar
[13]HSMS-285x Series Surface Mount Zero Bias Schottky Detector Diodes, datasheet, Avago Technology, July 2008.Google Scholar
[14]Square Law and Linear Detection, Application Note 986, Avago technologies, December 2006.Google Scholar
[15]The Zero Bias Schottky Detector Diode, Application Note 969, Avago technologies, December 2006.Google Scholar
[16]Kaddour, D. et al. : Design guidelines for low-loss slow-wave coplanar transmission lines in RF-CMOS technology. Microw. Opt. Technol. Lett., 50 (12) (2008), 30293036.CrossRefGoogle Scholar
[17]Abdel Aziz, M. et al. : Shielded coplanar striplines for RF integrated applications. Microw. Opt. Technol. Lett., 51 (2009), 352358.CrossRefGoogle Scholar
[18]Issa, H.; Duchamp, J.-M.; Ferrari, P.: 2008 IEEE MTT-S Int. Microwave Symp. Digest, June 2008, 671674.CrossRefGoogle Scholar
[19]MC 1% Series, Thick Film Chip Resistors, datasheet, multicomp, May 2006.Google Scholar