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Characterization of Free Volume in a Bulk Metallic Glass Using Positron Annihilation Spectroscopy

Published online by Cambridge University Press:  31 January 2011

K. M. Flores ,
D. Suh ,
R. H. Dauskardt ,
P. Asoka-Kumar ,
P. A. Sterne  and
R. H. Howell
K. M. Flores
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305–2205
D. Suh
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305–2205
R. H. Dauskardt
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305–2205
P. Asoka-Kumar
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550
P. A. Sterne
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550
R. H. Howell
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550
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Extract

The free volume of metallic glasses has a significant effect on atomic relaxation processes, although a detailed understanding of the nature and distribution of free volume sites is currently lacking. Positron annihilation spectroscopy was employed to study free volume in a Zr–Ti–Ni–Cu–Be bulk metallic glass following plastic straining and cathodic charging with atomic hydrogen. Multiple techniques were used to show that strained samples had more open volume, while moderate hydrogen charging resulted in a free volume decrease. It was also shown that the free volume is associated with zirconium and titanium at the expense of nickel, copper, and beryllium. Plastic straining led to a slight chemical reordering.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 5 , May 2002 , pp. 1153 - 1161
Copyright
Copyright © Materials Research Society 2002

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References

1.Krause-Rehberg, R. and Leipner, H.S., Positron Annihilation in Semi-conductors (Springer, Berlin, Germany, 1999), p. 5.Google Scholar
2.Nagel, C., Ratzke, K., Schmidtke, E., Wolff, J., and Faupel, F., Phys. Rev. B 57, 10224 (1998).Google Scholar
3.Asoka-Kumar, P., Hartley, J., Howell, R., and Nieh, T.G., App. Phys. Let. 77, 1973 (2000).CrossRefGoogle Scholar
4.Leamy, H.J., Chen, H.S., and Wang, T.T., Metall. Trans. 3, 699 (1972).CrossRefGoogle Scholar
5.Pampillo, C.A., Scripta Metall. 6, 915 (1972).CrossRefGoogle Scholar
6.Masumoto, T. and Maddin, R., Acta Metall. 19, 725 (1971).CrossRefGoogle Scholar
7.Flores, K.M. and Dauskardt, R.H., J. Mater. Res. 14, 638 (1999).CrossRefGoogle Scholar
8.Cameron, K. and Dauskardt, R.H. (2001, unpublished).Google Scholar
9.Spaepen, F., Acta Metall. 25, 407 (1977).CrossRefGoogle Scholar
10.Steif, P.S., Spaepen, F., and Hutchinson, J.W., Acta Metall. 30, 447 (1982).CrossRefGoogle Scholar
11.Pampillo, C.A. and Chen, H.S., Mater. Sci. Eng. 13, 181 (1974).Google Scholar
12.Suh, D. and Dauskardt, R.H., Scripta Mater. 42, 233 (2000).CrossRefGoogle Scholar
13.Argon, A.S., Acta Metall. 27, 47 (1979).Google Scholar
14.Asoka-Kumar, P., Alatalo, M., Ghosh, V.J., Kruseman, A.C., Nielsen, B., and Lynn, K.G., Phys. Rev. Lett. 77, 2097 (1996).CrossRefGoogle Scholar
15.Hartley, J.H., Howell, R.H., and Sterne, P.A., in Applications of Accelerators in Research and Industry, edited by Duggan, J.L. and Morgan, I.L. (American Institute of Physics, New York, 1999).Google Scholar
16.Matsui, S., J. Phys. Soc. Jpn. 61, 187 (1992).CrossRefGoogle Scholar
17.Flores, K.M., Suh, D., Asoka-Kumar, P., Sterne, P.A., Howell, R., and Dauskardt, R.H., (2002, unpublished).Google Scholar
18.Suh, D., Asoka-Kumar, P., and Dauskardt, R.H., Acta Mater. 50, 537 (2001, in press).CrossRefGoogle Scholar
19.Puska, M.J. and Nieminen, R.M., Rev. Mod. Phys. 66, 841 (1994).CrossRefGoogle Scholar