Hostname: page-component-84b7d79bbc-5lx2p Total loading time: 0 Render date: 2024-07-26T19:17:02.343Z Has data issue: false hasContentIssue false

Nanoindentation of a 10 nm thick thin film

Published online by Cambridge University Press:  31 January 2011

Takeshi Sawa
Affiliation:
Department of Mechanical Engineering, Nagaoka University of Technology, 1603–1 Kamitomioka, Nagaoka, Niigata, 940–2188, Japan
Yasushi Akiyama
Affiliation:
Department of Mechanical Engineering, Nagaoka University of Technology, 1603–1 Kamitomioka, Nagaoka, Niigata, 940–2188, Japan
Atsushi Shimamoto
Affiliation:
Department of Mechanical Engineering, Nagaoka University of Technology, 1603–1 Kamitomioka, Nagaoka, Niigata, 940–2188, Japan
Kohichi Tanaka*
Affiliation:
Department of Mechanical Engineering, Nagaoka University of Technology, 1603–1 Kamitomioka, Nagaoka, Niigata, 940–2188, Japan
*
c)Address all correspondence to this author. e-mail: tanaka@mech.nagaokaut.ac.jp
Get access

Abstract

In a nanometer order nanoindentation test, roundness or truncation of the indenter tip cannot be avoided. In this paper, we have analyzed the indentation problem of a rounded triangular indentation into a layered elastic half-space by a finite element analysis and then established a method to estimate the intrinsic elastic modulus of the film from the nanoindentation data. The method was applied to analyze the nanoindentation data of a less-than-10 nm penetration depth on a 10 nm thick diamondlike carbon film deposited on a 50 nm thick magnetic layer.

Type
Articles
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Doerner, M. F. and Nix, W.D., J. Mater. Res. 1, 601 (1986).CrossRefGoogle Scholar
2.King, R. B., Int. J. Solids Struct. 23, 1657 (1987).CrossRefGoogle Scholar
3.Meňcik, J., Munz, D., Quandt, E., Weppelmann, E.R., and Swain, M.V., J. Mater. Res. 12, 2475 (1997).CrossRefGoogle Scholar
4.Gao, H., Chiu, C. H., and Lee, J., Int. J. Solids Struct. 29, 2471 (1992).Google Scholar
5.Shimamoto, A., Tanaka, K., Akiyama, Y., and Yoshizaki, H., Philos. Mag. A 74 (5), 1097 (1996).CrossRefGoogle Scholar
6.Murakami, Y., Tanaka, K., Itokazu, M., and Shimamoto, A., Philos. Mag. A 69 (6), 1131 (1994).CrossRefGoogle Scholar
7.Shimamoto, A. and Tanaka, K., Rev. Sci. Instrum. 68 (9), 3494 (1997).CrossRefGoogle Scholar
8.Shimamoto, A. and Tanaka, K., Appl. Opt. 34 (25), 5854 (1995).CrossRefGoogle Scholar
9.Jiang, X., Reichelt, K., and Stritzer, B., J. Appl. Phys. 68 (3), 1018 (1990).CrossRefGoogle Scholar