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Nano-sclerometry measurements of superhard materials and diamond hardness using scanning force microscope with the ultrahard fullerite C60 tip

Published online by Cambridge University Press:  31 January 2011

V. Blank
Affiliation:
Research Center for Superhard Materials, Troitsk, Moscow reg., 142092, Russia and Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
M. Popov
Affiliation:
Research Center for Superhard Materials, Troitsk, Moscow reg., 142092, Russia and Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
N. Lvova
Affiliation:
Institute of Spectroscopy of the Russian Academy of Sciences, Troitsk, Moscow reg., 142092, Russia
K. Gogolinsky
Affiliation:
High Technology Electronics, Zelenograd, Moscow K-681, P.O. Box 6, 103681, Russia
V. Reshetov
Affiliation:
Moscow Physical Engineering Institute, Moscow, 115409, Russia
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Abstract

The new procedure for the hardness measurements of superhard materials including diamond using the scanning force microscope with the ultrahard fullerite C60 tip was developed. It is shown that diamond is plastically deformed under the indentation by the ultrahard fullerite indenter at room temperature. Now the correct measurements of diamond hardness have become possible. The hardness values measured are 137 ± 6 and 167 ± 5 GPa for the diamond faces (100) and (111), respectively.

Type
Articles
Copyright
Copyright © Materials Research Society 1997

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References

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