Hostname: page-component-77c89778f8-gvh9x Total loading time: 0 Render date: 2024-07-20T19:20:37.417Z Has data issue: false hasContentIssue false
  • English
  • Français

Optical Properties of Laser-dye-doped Polyvinylcarbazole Films Coated with Polycarbonate

Published online by Cambridge University Press:  31 January 2011

A. Arena ,
F. Bonsignore ,
S. Patanè  and
G. Saitta
A. Arena
Affiliation:
Istituto Nazionale per la Fisica della Materia (INFM) and Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Universitádi Messina, Salita Sperone 31, c.p.57, I-98166 Messina, Italy
F. Bonsignore
Affiliation:
Istituto Nazionale per la Fisica della Materia (INFM) and Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Universitádi Messina, Salita Sperone 31, c.p.57, I-98166 Messina, Italy
S. Patanè
Affiliation:
Istituto Nazionale per la Fisica della Materia (INFM) and Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Universitádi Messina, Salita Sperone 31, c.p.57, I-98166 Messina, Italy
G. Saitta
Affiliation:
Istituto Nazionale per la Fisica della Materia (INFM) and Dipartimento di Fisica della Materia e Tecnologie Fisiche Avanzate, Universitádi Messina, Salita Sperone 31, c.p.57, I-98166 Messina, Italy
Get access

Abstract

Spectrophotometry in the ultraviolet-visible-infrared range was used to investigate the optical properties of polymer bilayers obtained by spin coating polycarbonate films about 1 μm thick on top of pyrromethene-doped polyvinylcarbazole (PVK) layers deposited on glass. Due to the light confinement in the PVK plane, the laser-dye photoluminescence collected along the polymer plane was linearly polarized and shifted from green to yellow according to the active film thickness. To laterally contain light, microstructures were imprinted on laser-dye-doped PVK films by soft lithography. The photoluminescence coming out of a microstructured film and the film topography were analyzed by scanning near-field optical microscopy.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 6 , June 2002 , pp. 1490 - 1494
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Weber, M.F., Stover, C.A., Gilbert, L.R., Nevitt, T.J., and Ouderkirk, A.J., Science 287, 2451 (2000).CrossRefGoogle Scholar
2.Otomo, A., Yokoyama, S., Nakahama, T., and Mashiko, S., Appl. Phys. Lett. 77, 3881 (2000).CrossRefGoogle Scholar
3.Riechel, S., Lemmer, U., Feldmann, J., Benstem, T., Kowalsky, W., Scherf, U., Gombert, A., and Wittwer, V., Appl. Phys. B 71, 897 (2000).CrossRefGoogle Scholar
4.Reisfeld, W. and Yariv, E., Opt. Appl. 30, 481 (2000).Google Scholar
5.Reisfeld, R., Opt. Mater. 16, 1 (2001).CrossRefGoogle Scholar
6.Yariv, E., Schultheiss, S., Saraidarov, T., and Reisfeld, R., Opt. Mater. 16, 29 (2001).CrossRefGoogle Scholar
7.Riechel, S., Lemmer, U., Feldmann, J., Berleb, S., Mu¨ckl, A.G., Bru¨tting, W., Gombert, A., and Wittwer, W., Optics Lett. 26, 593 (2001).CrossRefGoogle Scholar
8.Lecomte, S., Gubler, U., Ja¨ger, M., Bosshard, Ch., Montemezzani, G., Gu¨nter, P., Gobbi, L., and Diederich, F., Appl. Phys. Lett. 77, 921 (2000).CrossRefGoogle Scholar
9.Tomov, A.V. and Voitenkov, A.I., Optics Commun. 174, 133 (2000).CrossRefGoogle Scholar
10.Rezig, H. and Vitrant, G., Optics Commun. 200, 261 (2001).CrossRefGoogle Scholar
11.Dalton, L.R., Opt. Eng. 39, 589 (2000).CrossRefGoogle Scholar
12.Kim, J.S., Friend, R.H., and Cacialli, F., Appl. Phys. Lett. 74, 3084 (1999).CrossRefGoogle Scholar
13.Bulovic, V., Deshpande, R., Thomson, M.E., and Forrest, S.R., Chem. Phys. Lett. 308, 317 (1999).CrossRefGoogle Scholar
14.Matters, M., Leeuw, D.M. de, Vissenberg, M.J.C.M., Hart, C.M., Herwig, P.T., Geuns, T., Mutsaers, C.M.J., and Drury, C.J., Opt. Mater. 13, 189 (1999).CrossRefGoogle Scholar
15.Yang, P., Wirnsberger, G., Huang, H.C., Cordero, S.R., McGehee, M.D., Scott, B., Deng, T., Withesides, G.M., Chmelka, B.F., Buratto, S.K., and Stucky, G.D., Science 287, 465 (2000).CrossRefGoogle Scholar
16.Riechel, S., Lemmer, U., Feldmann, J., Benstem, T., Kowalsky, W., Scherf, U., Gombert, A., and Wittwer, V., Appl. Phys. B 71, 897 (2000).CrossRefGoogle Scholar
17.Sheridan, A.K., Turnbull, G.A., Safonov, A.N., and Samuel, I.D.W., Phys. Rev. B 62, R11929 (2000).CrossRefGoogle Scholar
18.Gucciardi, P.G., Labardi, M., Gennai, S., Lazzeri, F., and Allegrini, M., Rev. Sci. Instrum. 68, 3088 (1997).CrossRefGoogle Scholar
19.Betzig, E., Finn, P.L., and Weiner, J.S., Appl. Phys. Lett. 60, 2484 (1992).CrossRefGoogle Scholar
20.Grober, R.D., Harris, T.D., Trautman, J.K., and Betzig, E., Rev. Sci. Instrum. 65, 626 (1994).CrossRefGoogle Scholar