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Phenomenological description of grain growth stagnation for nanocrystalline films and powders

Published online by Cambridge University Press:  31 January 2011

Rand Dannenberg
Affiliation:
AFG Development Corporation, Petaluma, California 94954
Eric Stach
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, California 94720
Joanna R. Groza
Affiliation:
Chemical Engineering/Materials Science Department, UC Davis, Davis, CA 95616
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Abstract

We provide a phenomenological grain growth stagnation force incorporating a near-linear temperature dependence of stagnated grain sizes and irreversible growth. The resulting law captures the observation of the restart of grain growth in the size versus time plateau on temperature increases. This description also reduces to standard laws commonly used for data fitting. The law may be useful for workers who wish to characterize a nanocrystalline film or powder annealing process predictively from a limited number of measurements or may be useful in a designed experiment. Other laws are discussed and compared. Fits to size versus time data from the literature are successfully made.

Type
Articles
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1.Dannenberg, R., Groza, J., Stach, E., and Dresser, B., Thin Solid Films 370, 54 (2000).CrossRefGoogle Scholar
2.Dannenberg, R., Groza, J., Stach, E., and Dresser, B., Thin Solid Films 379, 133 (2000).CrossRefGoogle Scholar
3.Malow, T.R. and Koch, C.C., Acta Mater. 45, 2177 (1997).CrossRefGoogle Scholar
4.Zhou, L.Z. and Guo, J.T., Scr. Mater. 40, 139 (1999).CrossRefGoogle Scholar
5.Kizuka, T., Ichinose, H., and Ishida, Y., J. Mater. Sci. 32, 1501 (1997).CrossRefGoogle Scholar
6.Kim, H.G. and Kim, K.T., Acta Mater. 47, 3561 (1999).CrossRefGoogle Scholar
7.Sturm, A., Betz, U., Scipione, C., and Hahn, H., Nanostruct. Mater. 11, 651 (1999).CrossRefGoogle Scholar
8.Shi, J.L., J. Mater. Res. 14, 1389 (1999).CrossRefGoogle Scholar
9.Smith, C.S., Trans. AIME 175, 15 (1948).Google Scholar
10.Von Neumann, J., Met. Interfaces, ASM 108 (1952).Google Scholar
11.King, A.H. (private communication).Google Scholar