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Self-organization of phthalocyanines on Al2O3 (1120) in aligned and ordered films

Published online by Cambridge University Press:  03 March 2011

E. Barrena ,
J.O. Ossó ,
F. Schreiber ,
M. Garriga ,
M.I. Alonso  and
H. Dosch
E. Barrena*
Affiliation:
Max-Planck-Institut für Metallforschung, 70569 Stuttgart, Germany
J.O. Ossó
Affiliation:
Max-Planck-Institut für Metallforschung, 70569 Stuttgart, Germany, and Institut de Ciència de Materials de Barcelona - CSIC, Esfera UAB, 08193 Bellaterra, Spain
F. Schreiber
Affiliation:
Physical and Theoretical Chemistry Laboratory, University of Oxford, Oxford OX13QZ, United Kingdom
M. Garriga
Affiliation:
Institut de Ciència de Materials de Barcelona - CSIC, Esfera UAB, 08193 Bellaterra, Spain
M.I. Alonso
Affiliation:
Institut de Ciència de Materials de Barcelona - CSIC, Esfera UAB, 08193 Bellaterra, Spain
H. Dosch
Affiliation:
Max-Planck-Institut für Metallforschung, 70569 Stuttgart, Germany, and Theoretische und Angewandte Physik, Universität Stuttgart, 70550 Stuttgart, Germany
*
a) Address all correspondence to this author. e-mail: barrena@mf.mpg.de
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Abstract

We studied the self-organization process of F16CuPc films (20–30 ML) on stepped Al2O3 (1120) substrates. X-ray diffraction measurements revealed a highly ordered layered structure with the molecules in a nearly upright configuration. The morphology, investigated by atomic force microscopy, consisted of long (several microns) and narrow (20–100 nm) needlelike terraces unidirectionally aligned along one of the main crystallographic directions of the Al2O3 (1120) surface. High resolution atomic force microscopy images revealed in-plane molecular order with the molecular stacking direction parallel to the needlelike terraces. Such anisotropic morphology is the result of a self-organization process of F16CuPc in elongated crystallites driven to a preferential orientation by the interaction with the substrate. Spectroscopic ellipsometry showed that these films exhibit anisotropic optical properties correlated with the molecular arrangement.

Keywords

OrganicScanning probe microscopy (SPM)Molecular beam epitaxy (MBE)
Type
Articles—Organic Electronics Special Section
Information
Journal of Materials Research , Volume 19 , Issue 7 , July 2004 , pp. 2061 - 2067
Copyright
Copyright © Materials Research Society 2004

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