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Structural characterization of Yba2Cu3O7–δ/Y2O3 composite films

Published online by Cambridge University Press:  31 January 2011

P. R. Broussard ,
M. A. Wall  and
J. Talvacchio
P. R. Broussard
Affiliation:
Naval Research Laboratory, Washington, DC 20375
M. A. Wall
Affiliation:
Lawrence Livermore National Laboratory, Livermore, California 94550
J. Talvacchio
Affiliation:
Northrop Grumman Science and Technology Center, Pittsburgh, Pennsylvania 15235
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Abstract

Using 4-circle x-ray diffraction and transmission electron microscopy, we have studied the microstructure and in-plane orientation of the phases present in thin film composite mixtures of Yba2Cu3O7–δ and Y2O3. We see a high degree of in-plane orientation and have verified a previous prediction for the in-plane order of Y2BaCuO5 on (110) MgO. Transmission electron microscopy shows the composite films to be a mixture of two phases, with YBCO grain sizes of ≈1 μm. We have also compared our observations of the in-plane order to the predictions of a modified near coincidence site lattice model.

Type
Articles
Information
Journal of Materials Research , Volume 13 , Issue 4 , April 1998 , pp. 954 - 958
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1.Watson, I. M., Atwood, M. P., and Cumberbatch, J. J., Thin Solid Films 251, 51 (1994).CrossRefGoogle Scholar
2.Broussard, P. R., Cestone, V. C., and Allen, L. H., J. Appl. Phys. 77, 252 (1995).CrossRefGoogle Scholar
3.Waytena, G. L., Hoff, H. A., Vold, C. L., Broussard, P. R., Claassen, J. H., Cestone, V. C., and Sprague, J. A., J. Appl. Phys. 76, 2380 (1994).CrossRefGoogle Scholar
4.Ravi, T. S., Hwang, D. M., Ramesh, R., Siu-Wai Chan, Nazer, L., Chen, C. Y., Inam, A., and Venkatesan, T., Phys. Rev. B 42, 10 141 (1990); D. M. Hwang, T. S. Ravi, R. Ramesh, Siu-Wai Chan, C. Y. Chen, L. Nazer, X. D. Wu, A. Inam, and T. Venkatesan, Appl. Phys. Lett. 57, 1690 (1990).CrossRefGoogle Scholar
5.Williams, E. J. and Stobbs, W. M., Physica C 208, 96 (1993).CrossRefGoogle Scholar
6.Hirata, K., Yamamoto, K., Iijima, K., Takada, J., Terashima, T., Bando, Y., and Mazaki, H., Appl. Phys. Lett. 56, 683 (1990).CrossRefGoogle Scholar
7.Ying, Q. Y., Hilbert, C., Kumar, N., Eichman, D., Thompson, M., Kroger, H., and Hwang, D. M., Appl. Phys. Lett. 59, 3037 (1991).CrossRefGoogle Scholar