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Application of the bond valence method to Si/NiSi2 interfaces
Published online by Cambridge University Press: 31 January 2011
Abstract
It is shown how the bond valence method can be used to estimate expected interatomic distances in coherent interfaces. The method is illustrated by application to the Si/NiSi2 (111) interface with results generally in accord with experimental data.
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- Copyright © Materials Research Society 1991
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