Hostname: page-component-7479d7b7d-m9pkr Total loading time: 0 Render date: 2024-07-13T17:24:14.587Z Has data issue: false hasContentIssue false
  • English
  • Français

Diffraction imaging of polycrystalline materials

Published online by Cambridge University Press:  31 January 2011

David R. Black ,
Harold E. Burdette ,
Masao Kuriyama  and
Richard D. Spal
David R. Black
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Harold E. Burdette
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Masao Kuriyama
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Richard D. Spal
Affiliation:
Materials Science and Engineering Laboratory, National Institute of Standards and Technology, Gaithersburg, Maryland 20899
Get access

Abstract

A new diffraction imaging technique for the characterization of polycrystalline materials is proposed and applied to obtain direct information about individual grains and their size and shape distributions and, in turn, strains in these materials. Unlike traditional powder diffractometry, where divergent and focusing x-ray optics are essential to collect information from an ensemble of grains, the nearly parallel and monochromatic beam available from a synchrotron x-ray source is employed to observe and measure diffraction images from individual grains and component particles in consolidated materials prepared by various processes. Images can be recorded by traditional methods, such as film and pulse counting detectors, but modern image detectors, such as charge coupled device (CCD) detectors and image analyzers, make the proposed imaging technique more practical. Unlike traditional diffractometry, this new technique provides the ability to measure shape, size, and strain without model based analyses. The spatial distribution of strain within individual grains, displayed as a diffraction image (topograph), indicates the presence of defects, such as dislocations, subgrain boundaries, and precipitates, and sheds new light on the origins of residual strains (stresses) in industrial materials. The resolution of the imaging system used is limited to grains ∼10 μm or larger due to diffraction broadening (∼20” from the size effect) and the resolution of the recording medium.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 7 , July 1991 , pp. 1469 - 1476
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Hug, H. P. and Alexander, L. E., X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials, 2nd ed. (John Wiley and Sons, New York, 1974), Chap. 9, p. 618.Google Scholar
2.Yazici, R., Mayo, N., Takemoto, T., and Weissmann, S., J. Appl. Crystallogr. 16, 89 (1983).CrossRefGoogle Scholar
3.Chikaura, Y., Yoneda, Y., and Hildebrandt, G., J. Appl. Crystallogr. 15, 4854 (1982).CrossRefGoogle Scholar
4.Yoneda, Y. and Chikaura, Y., Z. Naturforsh. 37a, 412–418 (1982).CrossRefGoogle Scholar
5.Spal, R., Dobbyn, R.C., Burdette, H.E., Long, G.G., Boettinger, W.J., and Kuriyama, M., Nucl. Instrum. Methods 222, 189 (1984).CrossRefGoogle Scholar
6.Kuriyama, M., Steiner, B. W., and Dobbyn, R. C., Ann. Rev. Mater. Sci. 19, 183 (1989).CrossRefGoogle Scholar
7.Kuriyama, M. and Boettinger, W.J., Acta Crystallogr. A32, 511 (1976).CrossRefGoogle Scholar
8.Barrett, C. S. and Massalski, T. B., Structure of Metals, 3rd ed. (McGraw-Hill Book Co., New York, 1966), p. 555.Google Scholar