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The elastic biaxial modulus of Ag–Pd multilayered thin films measured using the bulge test

Published online by Cambridge University Press:  03 March 2011

Martha K. Small ,
Brian J. Daniels ,
Bruce M. Clemens  and
William D. Nix
Martha K. Small
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305
Brian J. Daniels
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305
Bruce M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305
William D. Nix
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, California 94305
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Abstract

Analysis and sample preparation techniques for the bulge test have been improved to the point where the test can provide reliable and accurate measurements of the mechanical properties of thin films. Ag-Pd multilayer films of variable bilayer period were prepared for this study and characterized by cross-section transmission electron microscopy and by x-ray methods. The films were tested in the bulge test to determine their biaxial moduli. The data show no peak in biaxial modulus at a critical composition wavelength and no nonlinear elastic behavior. They do show a slight trend toward increasing elastic modulus with increasing strength of (111) crystallographic texture. These findings refute a previous report of the “supermodulus” effect in this system and add to the evidence that the effect is caused by artifacts of the mechanical testing technique. Methods for eliminating such artifacts are discussed.

Type
Articles
Information
Journal of Materials Research , Volume 9 , Issue 1 , January 1994 , pp. 25 - 30
Copyright
Copyright © Materials Research Society 1994

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References

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