Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-18T09:16:54.792Z Has data issue: false hasContentIssue false
  • English
  • Français

The intercalation of Ar into C60 films

Published online by Cambridge University Press:  31 January 2011

G. E. Gadd ,
P. J. Evans ,
S. Moricca  and
M. James
G. E. Gadd
Affiliation:
Australian Nuclear Science and Technology Organisation, Private Mail Bag 1, Menai, NSW 2234, Australia
P. J. Evans
Affiliation:
Australian Nuclear Science and Technology Organisation, Private Mail Bag 1, Menai, NSW 2234, Australia
S. Moricca
Affiliation:
Australian Nuclear Science and Technology Organisation, Private Mail Bag 1, Menai, NSW 2234, Australia
M. James
Affiliation:
Australian Nuclear Science and Technology Organisation, Private Mail Bag 1, Menai, NSW 2234, Australia
Get access

Abstract

In this Communication we discuss how unimplanted and implanted films (Y and Au implanted) of C60, when hot isostatically pressed (HIPed) at a pressure of 170 MPa (1.7 kbar) of Ar and temperatures of 300 or 400 °C, show substantial uptake of Ar into the film. Rutherford backscattering (RBS) provides an effective method for elucidating film composition, showing the films to have ∼1.5 at.% of Ar, consistent with a stoichiometry close to Ar1 C60. The Ar was found to diffuse from the films when these were held in a vacuum at 300 °C. It could subsequently be reincorporated into the film by re-HIPing, with uptake of a similar amount of Ar. IR spectroscopy showed that the C60 IR absorptions remain unchanged throughout uptake of the Ar and its subsequent loss during heating at 300 °C. It appears that the Ar is trapped interstitially in the films outside the C60 cages.

Type
Articles
Information
Journal of Materials Research , Volume 12 , Issue 1 , January 1997 , pp. 1 - 4
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Gallagher, P. K. and Zhong, Z., J. Thermal Anal. 38, 2247 (1992).CrossRefGoogle Scholar
2.Assink, R. A., Schirber, J. E., Loy, D. A., Morosin, B., and Carlson, G. A., J. Mater. Res. 7, 2136 (1992).CrossRefGoogle Scholar
3.Schirber, J. E., Kwei, G. H., Jorgensen, J. D., Hitterman, R. L., and Morosin, B., Phys. Rev. B 51, 12014 (1995).CrossRefGoogle Scholar
4.Palmetshofer, L., Geretschager, M., Kastner, J., Kuzmany, H., and Piplits, K., J. Appl. Phys. 77, 1029 (1995).CrossRefGoogle Scholar
5.Kastner, J., Palmetshofer, L., and Kuzmany, H., Appl. Phys. Lett. 65, 543 (1994).CrossRefGoogle Scholar
6.Ren, Z. M., Xu, X. L., Du, Y. C., Ying, Z. F., Xiong, X. X., and Li, F. M., Nucl. Instrum. Methods B 100, 55 (1995).CrossRefGoogle Scholar
7.Gupta, B. K., Bhushan, B., Capp, C., and Coe, J. V., J. Mater. Res. 9, 2823 (1994).CrossRefGoogle Scholar
8.Chu, W. K., Mayer, J. W., and Nicolet, M. A., Backscattering Spectrometry (Academic, New York, 1978).CrossRefGoogle Scholar
9.Feldman, L. C. and Mayer, J. W., Fundamentals of Surface and Thin Film Analysis (North-Holland, New York, 1986), pp. 13–68.Google Scholar
10.Doolittle, L. R., Nucl. Instrum. Methods B 9, 334 (1985).CrossRefGoogle Scholar
11.Saunders, M., Vazquez, H. A. Jimenez, Cross, R. J., Mrockowski, S., Gross, M., Giblin, D. E., and Poreda, R. J., J. Am. Chem. Soc. 116, 2193 (1994).CrossRefGoogle Scholar