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Optical breakdown threshold in fused silica with femtosecond laser pulses

Published online by Cambridge University Press:  24 July 2013

A. Bendib ,
K. Bendib-Kalache  and
C. Deutsch
A. Bendib*
Affiliation:
Quantum Electronic Laboratory, Faculty of Physics, USTHB, Algiers, Algeria
K. Bendib-Kalache
Affiliation:
Quantum Electronic Laboratory, Faculty of Physics, USTHB, Algiers, Algeria
C. Deutsch
Affiliation:
Laboratoire de physique des gaz et des plasmas, UMR 8578, Université Paris-Sud 11, Orsay, France
*
Address correspondence and reprint requests to: A. Bendib, Quantum Electronic Laboratory, Faculty of Physics, USTHB, El Alia BP 32, Bab Ezzouar 16111, Algiers, Algeria. E-mail address: mbendib@hotmail.com
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Abstract

A theoretical model for electrons in the conduction band intend to investigate the optical breakdown threshold in femtosecond laser pulse-fused silica interaction is presented. The model is derived from a rate equation that includes the avalanche and multi-photon ionization processes of Thornber and Keldysh, respectively, and also the three-body and exciton recombination mechanisms. In addition, the time evolution of electron mean energy is also considered through the energy balance equation. The mean energy acts as a trigger for the avalanche mechanism. The evolution of electron density profiles is calculated and discussed with respect to the ionization and recombination mechanisms. The results for the fluence threshold as a function of the pulse duration fall in good agreement with the experimental data reported in the literature.

Keywords

DielectricsOptical breakdownUltra-short laser pulse
Type
Research Article
Information
Laser and Particle Beams , Volume 31 , Issue 3 , September 2013 , pp. 523 - 529
Copyright
Copyright © Cambridge University Press 2013 

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References

REFERENCES

Allenspacher, P., Hüttner, B. & Riede, W. (2003). Ultrashort pulse damage of Si and Ge semiconductors. SPIE 4932, 358–365.Google Scholar
Chen, J.K., Tzou, D.Y. & Beraun, J.E. (2005). Numerical investigation of ultrashort laser damage in semiconductors. Int. J. Heat & Mass Transfer 48, 501–509.CrossRefGoogle Scholar
Du, D., Liu, X. & Mourou, G. (1996). Reduction of multi-photon ionization in dielectrics due to collisions. Appl. Phys. B: Lasers & Optics 63, 617–621.CrossRefGoogle Scholar
Eidmann, K., Meyer-Ter-Vehn, J., Schlegel, T. & Hüller, S. (2000). Hydrodynamic simulation of subpicosecond laser interaction with solid-density matter. Phys. Rev. E 62, 1202–1214.CrossRefGoogle ScholarPubMed
Gamaly, E.G., Rode, A.V., Luther-Davies, B. & Tikhonchuk, V.T. (2002). Ablation of solids by femtosecond lasers: Ablation mechanism and ablation thresholds for metals and dielectrics. Phys. Plasmas 9, 949.CrossRefGoogle Scholar
Huba, J.D. (2000). NRL plasma Formulary. Washington, DC: Naval Research Laboratory.Google Scholar
Keldysh, L.V. (1965). Ionization in the field of a strong electromagnetic wave. Sov. Phys. JETP 20, 1307–1314.Google Scholar
Kirkwood, S.E., Tsui, Y.Y., Fedosejevs, R., Brantov, A.V. & Bychenkov, V.Yu. (2009). Experimental and theoretical study of absorption of femtosecond laser pulses in interaction with solid copper targets. Phys. Rev. B 79, 144120–144126.CrossRefGoogle Scholar
Lenzner, M., Krüger, J., Sartania, S., Cheng, Z., Spielmann, Ch., Mourou, G., Kautek, W. & Krausz, F. (1998). Femtosecond optical breakdown in dielectrics. Phys. Rev. Lett. 80, 4076–79.CrossRefGoogle Scholar
Li, M., Menon, S., Nibarger, J.P. & Gibson, G.N. (1999). Ultrafast electron dynamics in femtosecond optical breakdown of dielectrics. Phys. Rev. Lett. 82, 2394–97.CrossRefGoogle Scholar
Peñano, J.R., Sprangle, P., Hafizi, B., Manheimer, W. & Zigler, A. (2005). Transmission of intense femtosecond laser pulses into dielectrics. Phys. Rev. E 72, 036412–18.CrossRefGoogle ScholarPubMed
Perez, D., Beland, L.K., Derying, D., Lewis, L.J. & Meunier, M. (2008). Numerical study of the thermal ablation of wet solids by ultrashort laser pulses. Phys. Rev. B 77, 014108.CrossRefGoogle Scholar
Perez, D. & Lewis, J. (2002). Ablation of solids under femtosecond laser pulses. Phys. Rev. Lett. 89, 255504.CrossRefGoogle ScholarPubMed
Petite, G., Guizard, S., Martin, P. & Quéré, F. (1999). Comment on “Ultrafast electron dynamics in femtosecond optical breakdown of dielectrics.” Phys. Rev. Lett. 83, 5182–5182.CrossRefGoogle Scholar
Rajeev, P.P., Gertsvolf, M., Corkum, P.B. & Rayner, D.M. (2009). Field dependent avalanche ionization rates in dielectrics. Phys. Rev. Lett. 102, 083001.CrossRefGoogle ScholarPubMed
Rethfeld, B. (2004). Unified model for free-electron avalanche in laser-irradiated dielectrics. Phys. Rev. Lett. 92, 187401–04.CrossRefGoogle ScholarPubMed
Rethfeld, B., Brenk, O., Medvedev, N., Krutsch, H. & Hoffmann, D.H.H. (2010). Interaction of dielectrics with femtosecond laser pulses: application of kinetic approach and multiple rate equation. Appl. Phys. A 101, 19–25.CrossRefGoogle Scholar
Spitzer, L. & Härm, R. (1953). Transport phenomena in a completely ionized gas. Phys. Rev. 89, 977–981.CrossRefGoogle Scholar
Stoian, R., Rosenfeld, A., Ashkenasi, D., Hertel, I.V., Bulgakova, N.M. & Campbell, E.E.B. (2002). Surface charging and impulsive ion ejection during ultrashort pulsed laser ablation. Phys. Rev. Lett. 88, 097603.CrossRefGoogle ScholarPubMed
Strickland, D. & Mourou, G. (1985). Compression of amplified chirped optical pulses. Opt. Commun. 56, 219–221.CrossRefGoogle Scholar
Stuart, B.C., Feit, M.D., Herman, S., Rubenchik, A.M., Shore, B.W. & Perry, M.D. (1996). Nanosecond-to-femtosecond laser-induced breakdown in dielectrics. Phys. Rev. B 53, 1749–61.CrossRefGoogle ScholarPubMed
Stuart, B.C., Feit, M.D., Rubenchik, A.M., Shore, B.W. & Perry, M.D. (1995). Laser-induced damage in dielectrics with nanosecond to subpicosecond pulses. Phys. Rev. Lett. 74, 2248–51.CrossRefGoogle ScholarPubMed
Thornber, K.K. (1981). Applications of scaling to problems in high-field electronic transport. J. Appl. Phys. 52, 279–290.CrossRefGoogle Scholar
Tien, A.C., Backus, S., Kapteyn, H., Murnane, M. & Mourou, G. (1999). Short-pulse laser damage in transparent materials as a function of pulse duration. Phys. Rev. Lett. 82, 3883–6.CrossRefGoogle Scholar