Hostname: page-component-586b7cd67f-l7hp2 Total loading time: 0 Render date: 2024-11-25T14:15:00.602Z Has data issue: false hasContentIssue false
  • English
  • Français

1970-2014: From Space Ion Thrusters to Nano-Tools

Published online by Cambridge University Press:  27 August 2014

Pierre Sudraud
Pierre Sudraud*
Affiliation:
Orsay-Physics, Tescan Orsay Holding, Fuveau, France

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 304 - 305
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Crewe, AV, Wall, J, Langmore, J Science 168 (1970), p. 1338.Google Scholar
[2] Orloff, JH, Swanson, LW J. Vac. Sci. Technol. 12 (1975), p. 1209.Google Scholar
[3] Escovitz, WH, Fox, TR, Levi-Setti, R Proceedings of the National Academy of Sciences of the United States of America (1975), p. 1826.Google Scholar
[4] Krohn, VE, Ringo, GR Appl. Phys. Lett. 27 (1975), p. 479.Google Scholar
[5] Mahoney, JF, et al, J. Appl. Phys. 40 (1969), p. 5101.Google Scholar
[6] , P These d’Etat Université Paris XI Orsay (1979.Google Scholar
[7] Orloff, J, Utlaut, M, Swanson, L in “High resolution Focused Ion Beams: FIB and Its Applications”, Kluwer Academic / Plenum Publishers, New York.Google Scholar
[8] I thank all my colleagues from Orsay-Physics, and especially Dr. A. Delobbe and Dr. M. Talec for permanent scientific discussions and help.Google Scholar