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3-D Molecular Depth Profiling of Biological and Polymeric Materials Using Time-of-Flight Secondary Ion Mass Spectrometry

Published online by Cambridge University Press:  09 October 2013

P.A. Clark
Affiliation:
E. Tallarek
Affiliation:
D. Breitenstein
Affiliation:
B. Hagenhoff
Affiliation:
N. Havercroft
Affiliation:

Abstract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2013