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3D Atom Dynamics in Pt-NiO Nanocrystals
Published online by Cambridge University Press: 22 July 2022
Abstract
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- On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
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- Copyright © Microscopy Society of America 2022
References
Chen, F.-R., Van Dyck, D., Kisielowski, C., Hansen, L.P., Barton, B., Helveg, S., Nature Commun. 12 (2021), p. 5007. doi:10.1038/s41467-021-24857Google Scholar
Chen, F.-R., Van Dyck, D., Kisielowski, C., Nature Commun. 7 (2016), p. 10603. doi: 10.1038/s41467-021-24857-4Google Scholar
Van Dyck, D., Jinschek, J. R. & Chen, F. R. Big-Bang tomography as a new route to atomic resolution electron tomography. Nature 486, 243–246 (2012)CrossRefGoogle ScholarPubMed
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