Hostname: page-component-78c5997874-mlc7c Total loading time: 0 Render date: 2024-11-16T23:23:50.510Z Has data issue: false hasContentIssue false

3D Atom Dynamics in Pt-NiO Nanocrystals

Published online by Cambridge University Press:  22 July 2022

Fu-Rong Chen
Affiliation:
Department of Materials Science and Engineering, City University of Hong Kong, Kowloon Tong, Hong Kong, SAR.
Dirk Van Dyck
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Christian Kisielowski
Affiliation:
The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, USA
Hector A. Calderon*
Affiliation:
Instituto Politecnico Nacional, ESFM- Departamento de Física, Ed. 9, UPALM-Zacatenco, México CDMX, Mexico
*
*Corresponding author: frchen@cityu.edu.hk

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
Copyright
Copyright © Microscopy Society of America 2022

References

Chen, F.-R., Van Dyck, D., Kisielowski, C., Hansen, L.P., Barton, B., Helveg, S., Nature Commun. 12 (2021), p. 5007. doi:10.1038/s41467-021-24857Google Scholar
Chen, F.-R., Van Dyck, D., Kisielowski, C., Nature Commun. 7 (2016), p. 10603. doi: 10.1038/s41467-021-24857-4Google Scholar
Van Dyck, D., Jinschek, J. R. & Chen, F. R. Big-Bang tomography as a new route to atomic resolution electron tomography. Nature 486, 243246 (2012)CrossRefGoogle ScholarPubMed