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3D Atomic Scale Quantification of Nanostructures and their Dynamics Using Model-based STEM

Published online by Cambridge University Press:  30 July 2020

Sandra Van Aert ,
Annick De Backer ,
Annelies De wael ,
Jarmo Fatermans ,
Thomas Friedrich ,
Ivan Lobato ,
Colum O'Leary ,
Aakash Varambhia ,
Thomas Altantzis  and
Lewys Jones
...Show all authors
Sandra Van Aert
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Annick De Backer
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Annelies De wael
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Jarmo Fatermans
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Thomas Friedrich
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Ivan Lobato
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Colum O'Leary
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Aakash Varambhia
Affiliation:
Department of Materials, University of Oxford, Oxford, England, United Kingdom
Thomas Altantzis
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium
Lewys Jones
Affiliation:
Trinity College Dublin, Dublin, Dublin, Ireland
Arjan den Dekker
Affiliation:
imec-Vision Lab, University of Antwerp, Wilrijk, Antwerpen, Belgium
Peter Nellist
Affiliation:
University of Oxford, Oxford, England, United Kingdom
Sara Bals
Affiliation:
EMAT, NANOLab Center of Excellence, University of Antwerp, Antwerp, Antwerpen, Belgium

Abstract

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Type
Bridging the Fundamental Electron Dose Gap for Observing Atom Processes in Complex Materials in their Native Environments
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2606 - 2608
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Copyright
Copyright © Microscopy Society of America 2020

References

De Backer, A et al. , Nanoscale 9 (2017), p. 8791.10.1039/C7NR02656KCrossRefGoogle Scholar
Van Aert, S. et al. , Physical Review Letters 122 (2019), 066101.10.1103/PhysRevLett.122.066101CrossRefGoogle Scholar
Fatermans, J. et al. , Physical Review Letters 121 (2018), 056101.10.1103/PhysRevLett.121.056101CrossRefGoogle Scholar
Altantzis, T. et al. , Nano Letters 19 (2019), p. 477.10.1021/acs.nanolett.8b04303CrossRefGoogle Scholar
De wael, A. et al. , Physical Review Letters (2020), accepted for publication.Google Scholar
This work was supported by the European Research Council (Grant 770887 PICOMETRICS to SVA and Grant 815128 REALNANO to SB, Grant 823717 ESTEEM3). The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through project fundings, a postdoctoral grant to ADB and a doctoral grant to ADw.Google Scholar