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ab initio Electrostatic Potentials for 4D-STEM Ptychographic Reconstruction

Published online by Cambridge University Press:  22 July 2022

Jacob Madsen
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Christoph Hofer
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
Thomas C. Pekin
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik & IRIS, Adlershof, Berlin, Germany
Marcel Schloz
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik & IRIS, Adlershof, Berlin, Germany
Thuy An Bui
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
Christoph Koch
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik & IRIS, Adlershof, Berlin, Germany
Timothy J. Pennycook
Affiliation:
Electron Microscopy for Materials Science (EMAT), University of Antwerp, Antwerp, Belgium
Toma Susi*
Affiliation:
University of Vienna, Faculty of Physics, Vienna, Austria
*
*Corresponding author: toma.susi@univie.ac.at

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Copyright
Copyright © Microscopy Society of America 2022

References

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The authors acknowledge funding by the European Research Council (ERC) under the European Union's Horizon 2020 research and innovation programme (Grant agreement No. 756277-ATMEN and 802123-HDEM), and computational resources by the Vienna Scientific Cluster (VSC).Google Scholar