Hostname: page-component-77c89778f8-gvh9x Total loading time: 0 Render date: 2024-07-19T10:54:46.097Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration Corrector Tuning with Machine-Learning-Based Emittance Measurements and Bayesian Optimization

Published online by Cambridge University Press:  30 July 2021

Chenyu Zhang ,
Zhaslan Baraissov ,
Cameron Duncan ,
Adi Hanuka ,
Auralee Edelen ,
Jared Maxson  and
David Muller
Chenyu Zhang
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, New York, United States
Zhaslan Baraissov
Affiliation:
School of Applied and Engineering Physics, Cornell University, United States
Cameron Duncan
Affiliation:
Department of Physics, Cornell University, United States
Adi Hanuka
Affiliation:
SLAC National Accelerator Laboratory, United States
Auralee Edelen
Affiliation:
SLAC National Accelerator Laboratory, United States
Jared Maxson
Affiliation:
Department of Physics, Cornell University, United States
David Muller
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA, Ithaca, New York, United States

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 810 - 812
Check for updates
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Muller, D. A. Structure and bonding at the atomic scale by scanning transmission electron microscopy. Nat. Mater. 8, 263–270 (2009).Google ScholarPubMed
Floettmann, K. Some basic features of the beam emittance. Phys. Rev. Spec. Top. - Accel. Beams 6, 80–86 (2003).Google Scholar
Schramm, S. M., Van Der Molen, S. J. & Tromp, R. M. Intrinsic instability of aberration-corrected electron microscopes . Phys. Rev. Lett. 109, 1–5 (2012).CrossRefGoogle ScholarPubMed
Schnitzer, N., Sung, S. H. & Hovden, R. Optimal STEM Convergence Angle Selection Using a Convolutional Neural Network and the Strehl Ratio. Microsc. Microanal. 26, 921–928 (2020).CrossRefGoogle ScholarPubMed
Duris, J. et al. Supplemental Material for Bayesian Optimization of a Free-Electron Laser Gaussian fit Raster scan. 1–4 (2020).Google Scholar
van der Geer, S. B. & de Loos, M. J. General Particle Tracer (v3.1). 1–202 (2009).Google Scholar
Müller, H., Uhlemann, S., Hartel, P. & Haider, M. Advancing the hexapole Cs-corrector for the scanning transmission electron microscope. Microsc. Microanal. 12, 442–455 (2006).CrossRefGoogle ScholarPubMed
Funded by the Center for Bright Beams, an NSF STC (NSF PHY-1549132).Google Scholar