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Aberration-Corrected STEM by Means of Diffraction Gratings

Published online by Cambridge University Press:  27 August 2014

Martin Linck ,
Benjamin McMorran ,
Jordan Pierce  and
Peter Ercius
Martin Linck
Affiliation:
Corrected Electron Optical Systems GmbH, Heidelberg, Germany
Benjamin McMorran
Affiliation:
Department of Physics, University of Oregon, Eugene OR, United States
Jordan Pierce
Affiliation:
Department of Physics, University of Oregon, Eugene OR, United States
Peter Ercius
Affiliation:
ational Center for Electron Microscopy, LBNL, Berkeley CA, United States

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 946 - 947
Copyright
Copyright © Microscopy Society of America 2014 

References

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[3] Krivanek, O.L., Dellby, N., Lupini, A.R. Ultramicroscopy 78 (1999), 1-11.Google Scholar
[4] Verbeeck, J., Tian, H., Schattschneider, P. Nature, 467 (2010), 301 - 304.Google Scholar
[5] McMorran, , et al., Science 14 (2011), Vol. 331, No. 6014, 192-195.Google Scholar
[6] This work is supported by the Office of Science, Office of Basic Energy Sciences of the U.S. Department of Energy under Contract No. DE-AC02—05CH11231.Google Scholar